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IEEE International On-Line Testing Symposium (IOLTS'06)
CALL FOR PAPERS
Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies adversely impact noise margins and make integrating on-line test mandatory in many modern ICs. The Symposium is also emphasizing on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory and University of Bologna.
The topics include (but are not limited to) the following ones:
IOLTS Program Committee invites authors to submit papers in the above
areas. All submissions should have a title page with the name, address,
phone number, fax number, and e-mail address of the contact author. Accepted
papers will be included in formal Proceedings to be published by the IEEE.
Papers must be submitted electronically in PDF via the Symposium Web site.
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Audio Visual Chair
J. Abraham, U. Texas at Austin
For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts/
The 12th IEEE International On-Line Testing Symposium (IOLTS'06) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), and co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory and University of Bologna.
IEEE Computer Society– Test Technology Technical Council
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