TTTC's Electronic Broadcasting Service
Journal of Electronic Testing: Theory and Applications (JETTA)
Special Issue on
Test, Defect Tolerance, and Reliability of Nanoscale Devices
CALL FOR PAPERS
Due to their small feature sizes and self-assembly-based fabrication methods, nanoscale devices present many challenges in the area of testing, test automation, and defect tolerance. As nanoscale fabrication technologies evolve over the next few years, testing and reliability are expected to emerge as major roadblocks to system integration. The Journal of Electronic Testing: Theory and Applications seeks original manuscripts for a special issue on Test, Defect Tolerance, and Reliability of Nanoscale Devices, scheduled for publication in February 2007. The topics of interest include, but not limited to:
Prospective authors should follow the submission guidelines for the Journal of Electronic Testing: Theory and Applications (JETTA). Authors must indicate that their manuscript is being submitted to the Special Issue on Test, Defect Tolerance and Reliability of Nanoscale Devices. All manuscripts must be submitted electronically to the JETTA web site at http://jetta.edmgr.com/
Submission Deadline: March
IEEE Computer Society– Test Technology Technical Council
IEEE DESIGN & TEST EIC
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
This message contains public information only. You are invited to copy and distribute it further.
To remove your name from this mailing list, please email firstname.lastname@example.org or login to the TTTC Database and uncheck the EBS (Electronic Broadcast Service) box, which can modified by selecting "Edit" next to "My Subscriptions".