JETTA Special Issue on Nanoscale Devices

CALL FOR PAPERS

Scope -- Submission and Review Procedures

Scope

Due to their small feature sizes and self-assembly-based fabrication methods, nanoscale devices present many challenges in the area of testing, test automation, and defect tolerance. As nanoscale fabrication technologies evolve over the next few years, testing and reliability are expected to emerge as major roadblocks to system integration. The Journal of Electronic Testing: Theory and Applications seeks original manuscripts for a special issue on Test, Defect Tolerance, and Reliability of Nanoscale Devices, scheduled for publication in February 2007. The topics of interest include, but not limited to:

Novel defect-tolerant nano-circuits for memory, programmable fabrics, processors, and random logic
Defect tolerance techniques for crossbars, decoders/interfaces, and internal blocks
Manufacturing- and application-specific defect tolerance schemes
Defect tolerance of nano technologies such as QCA, Molecular electronics, Hybrid CMOS/nano
Static and dynamic redundancy analysis
Fault (defect) modeling for nanotechnologies, fault (defect) localization
Circuit- and system-level testing, pattern generation and application
Test and configuration time analysis, test and configuration time reduction, defect map analysis
Reliability and reconfiguration of nano devices
Tools and techniques for evaluating the reliability of nano devices
Nano-based computing paradigms, algorithms and optimizations, probabilistic design paradigms
Testing of nanoscale sensors and heterogeneous-technology nanodevices

Submission and Review Procedures

top

Prospective authors should follow the submission guidelines for the Journal of Electronic Testing: Theory and Applications (JETTA). Authors must indicate that their manuscript is being submitted to the Special Issue on Test, Defect Tolerance and Reliability of Nanoscale Devices. All manuscripts must be submitted electronically to the JETTA web site at http://jetta.edmgr.com/

Schedule:

Submission Deadline: March 3, 2006
Reviews Completed: June 16, 2006
Revisions Due (if necessary): July 21, 2006
Reviews of Revisions Completed (if necessary): September 9, 2006
Notification of Final Acceptance: September 18, 2006
Submission of Final Version: October 6, 2006
Target Publication Date: February 2007

Guest Editor:

Mohammad Tehranipoor
Computer Science and Electrical Eng. Dept.
University of Maryland, Baltimore Co. (UMBC)
Baltimore, MD
tehrani@umbc.edu