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International Test Synthesis Workshop (ITSW 2006)
CALL FOR PAPERS
Theme: Living with Imperfection
Growing density has increased the uncertainty of the manufacturing process to the point that it is very difficult to know IC characteristics prior to manufacture. Additional uncertainty is introduced by soft and hard errors accumulated during the lifetime of the IC. Uncertainty can manifest itself directly on the functionality of the chip (i.e. stuck-at, bridging, coupling faults, and etc.) or it can have more subtle impact device parameters such as path delay, clock skew, and leakage.
Testing becomes more critical in this context as a tool to characterize parts in terms of their level of functionality. In order to maintain high yield and durability in the field, defects and variations must be tolerated. Test synthesis, the consideration of test during the synthesis process, is essential to satisfy these strict requirements with low impact on design cost. The workshop will consider all aspects of test and test synthesis including, but not limited, to the following topics:
For more information, please refer to the web site: http://www.tttc-itsw.org.
present recent research results at the workshop, please submit an extended
abstract, one to three pages long, in PDF format, to the Program
Chair by January 20, 2006 via email. Please include
in your abstract the names, affiliations, and full contact information of
all authors. Also, please indicate which author will be the speaker if the
abstract is accepted for presentation. To support open discussion, no proceedings
of the workshop will be published. As in previous years, ITSW will present
a BEST Student Paper Award to encourage student participation
in the workshop
For general information, contact:
Submit paper proposals to:
For more information, visit us on the web at: http://www.tttc-itsw.org
The 13th International Test Synthesis Workshop (ITSW 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council
IEEE DESIGN & TEST EIC
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1ST VICE CHAIR
EAST & AFRICA
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