LATW 2006 - Call for Papers

CALL FOR PAPERS

Overview -- Submission Instructions -- Committees

Overview

The IEEE Latin-American Test Workshop (LATW) provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. The best papers of the 7th LATW will be invited to be re-submitted to IEEE Design and Test of Computers.

Submission Deadline: November 11th, 2005.
Notification of Acceptance: December 16th, 2005.
Camera Ready: January 18th, 2006.

Topics of interest include, but are not limited to:

Analog Mixed Signal Test
Automatic Test Generation
Built-In Self-Test
Defect-Based Test
Dependability Estimation
Design and Synthesis for Testability
Design Verification/Validation
E-Beam and Thermal Testing
Economics of Test
Fault Analysis and Diagnosis
Fault Modeling and Simulation
Fault-Tolerance in HW/SW
Fault-Tolerant Architectures
Memory Test and Repair
On-Line Testing
Process Control and Measurements
Radiation-Hardening Techniques
Software Fault-Tolerance
Software On-Line Testing
System-on-Chip Test
Test Resource Partitioning
Yield Optimization

Submission Instructions

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To encourage and facilitate informal discussions participation will be limited. Those interested in
presenting recent results at the workshop are invited to submit either an extended abstract, one to three
pages long, or a full length paper. PDF electronic submissions should be done via the workshop web page:

www.latw.net

Authors should send papers in the IEEE format with a cover letter indicating the complete mail address,
phone/fax numbers and e-mail addresses, the contact person and the presenter. Detailed instructions are
available at the workshop web page. The Program Committee also welcomes proposals for panels and
special topic sessions.

Committees

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General Chairs:
Fabian Vargas, PUCRS - Brazil
vargas@computer.org

Yervant Zorian, LogicVision - USA
y.zorian@computer.org

Honorary Chair:
Daniel Lupi, INTI - Argentina

Past General Chair:
Marcelo Lubaszewski, UFRGS - Brazil

Program Chairs:
Eduardo Bezerra, PUCRS – Brazil
Victor Champac, INAOE - Mexico

Embedded Tutorials Chair:
Magdy Abadir, Freescale - USA
Zebo Peng, Linkoping Univ. - Sweden

Panels Chairs:
Luigi Carro, UFRGS – Brazil
José Vicente Calvano, Braz. Navy – Brazil

TTEP Tutorials Chair:
D. Gizopoulus, Univ. of Piraeus – Greece

Publicity Chairs:
José Luis Huertas, IMSE / CNM - Spain
Marius Strum, USP - Brazil

Publication Chair:
Júlio Leão, PUCRS – Brazil

Industry Liaison:
César Dueñas, Freescale – Brazil

IEEE Design & Test Liaison:
K. Roy, Purdue Univ. – USA

Local Arrangements Chair:
Liliana Fraigi, INTI - Argentina

Asia Liaison:
Yoshio Mita. Univ. of Tokyo - Japan

East Europe Liaison:
R. Ubar, Tallinn Tech. Univ. – Estonia

West Europe Liaison:
M. L. Flottes, LIRMM – France

North America Liaison:
A. Chatterjee, Georgia Tech. – USA

Topic Coordinators:
L. Anghel, TIMA-INPG – France
F. Azais, LIRMM – France
J. Figueras, UPC – Spain
W. Jiang Chau, LME / USP – Brazil
F. L. Kastensmidt, UFRGS – Brazil
J. P. Teixeira, INESC-ID/IST – Portugal
R. Velazco, TIMA-INPG – France
A. Veneris, Univ. of Toronto – Canada
S. R. Vergilio, UFPR – Brazil

Program Committee:
J. Abraham – Univ. of Texas, USA
V. D. Agrawal - Auburn Univ., USA
L. Balado - UPC, Spain
A. Brun - Institut d´Optique, France
O. Calvo - UNLP, Argentina
R. Canetti – UROU, Uruguay
C. S. Cardenas – PUCP, Peru
E. P. Duarte Jr. - UFPR, Brazil
M. P. Gough – Univ. of Sussex, UK
J. L. Guntzel – UFPel, Brazil
C. W. Hawkins – Univ. of New Mexico, USA
J. P. Hayes - Univ. of Michigan, USA
A. Ivanov – U. B. Columbia, Canada
R. Leveugle – TIMA-INPG, France
M. Linares – INAOE, Mexico
J. C. Maldonado – ICMSC/USP, Brazil
A. Mesquita – UFRJ, Brazil
F. G. Moraes – PUCRS, Brazil
A. Orailoglu – UCSD, USA
G. Peretti - Fac. Reg. Villa María, Argentina
J. Perez – UROU, Uruguay
D. K. Pradhan – Univ. of Bristol, UK
R. Reis – UFRGS, Brazil
M. Renovel – LIRMM, France
M. S. Reorda - Politec. di Torino, Italy
E. Romero – UTN, Argentina
J. Salcedo – Texas Instruments, USA
A. Sarmiento – INAOE, Mexico
F. Silveira – UROU, Uruguay
M. Soma - Univ. of Washington, USA
A. A. Suzim – UFRGS, Brazil
J. M. de Souza – Lucent Tech, Brazil
L. E. Toledo - UCC, Argentina
T. Weber - UFRGS, Brazil
H. J. Wunderlich – Univ. Stuttgart, Germany
A. Zenteno – INAOE, Mexico
A. Zorzo – PUCRS, Brazil

Steering Committee:
V. Champac (Chair)
J. L. Huertas
M. S. Lubaszewski
F. Vargas
R. Velazco
Y. Zorian

For more information, visit us on the web at: http://www.latw.net

The 7th IEEE Latin American Test Workshop is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).