{"id":21,"date":"2014-05-26T11:31:35","date_gmt":"2014-05-26T15:31:35","guid":{"rendered":"http:\/\/sauron.polito.it\/tttc\/?page_id=21"},"modified":"2018-01-17T17:20:46","modified_gmt":"2018-01-17T16:20:46","slug":"scope","status":"publish","type":"page","link":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/?page_id=21","title":{"rendered":"Scope"},"content":{"rendered":"<table style=\"height: 743px;\" width=\"715\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td class=\"td1\" valign=\"top\">\n<blockquote>\n<p class=\"p1\"><span style=\"color: #ff6600;\"><em>TTTC&#8217;s interests encompass a wide variety of technologies, since each area in electronic test depends on its own specialized instrumentation and techniques.\u00a0<\/em><\/span><\/p>\n<\/blockquote>\n<p class=\"p1\">A number of technologies are usually needed to test a single product thereby increasing the challenge. TTTC&#8217;s current scope includes, but is not limited to:<\/p>\n<ul class=\"ul1\">\n<li>Testing of analog, digital, memory, FPGA, SiP, and RF Semiconductor circuits<\/li>\n<li>Testing of embedded cores, integrated circuits, MCMs, boards and systems<\/li>\n<li>Testability methods: built-in self-test, scan, and test synthesis<\/li>\n<li>Verification and Validation<\/li>\n<li>Embedded Test, ATE, Test resource partitioning<\/li>\n<li>Yield Optimization, defect\/fault tolerance and embedded repair methodologies<\/li>\n<li>Infrastructure IP<\/li>\n<li>On-line, IDDQ, thermal testing<\/li>\n<li>Transient faults, soft errors, robustness, field reliability<\/li>\n<li>Debug and Diagnosis<\/li>\n<\/ul>\n<p><span style=\"font-family: sans-serif; font-size: medium;\"><a href=\"http:\/\/sauron.polito.it\/tttc\/v2\/wp-content\/uploads\/2014\/05\/scope.jpg\"><img decoding=\"async\" loading=\"lazy\" class=\"aligncenter wp-image-5607\" src=\"http:\/\/sauron.polito.it\/tttc\/v2\/wp-content\/uploads\/2014\/05\/scope-1024x599.jpg\" alt=\"scope\" width=\"450\" height=\"263\" srcset=\"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/wp-content\/uploads\/2014\/05\/scope-1024x599.jpg 1024w, https:\/\/www.ieee-tttc.org\/worldwide\/europe\/wp-content\/uploads\/2014\/05\/scope-300x175.jpg 300w, https:\/\/www.ieee-tttc.org\/worldwide\/europe\/wp-content\/uploads\/2014\/05\/scope.jpg 1033w\" sizes=\"(max-width: 450px) 100vw, 450px\" \/><\/a><\/span><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>TTTC&#8217;s interests encompass a wide variety of technologies, since each area in electronic test depends on its own specialized instrumentation and techniques.\u00a0 A number of technologies are usually needed to [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":5457,"parent":13,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/pages\/21"}],"collection":[{"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=21"}],"version-history":[{"count":7,"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/pages\/21\/revisions"}],"predecessor-version":[{"id":6589,"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/pages\/21\/revisions\/6589"}],"up":[{"embeddable":true,"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/pages\/13"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=\/wp\/v2\/media\/5457"}],"wp:attachment":[{"href":"https:\/\/www.ieee-tttc.org\/worldwide\/europe\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=21"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}