Facebook
Twitter
Mail
Register to
TTTC newsletter
Membership
Should I join?
Benefits
Scope
Apply
People
Officers
Technical Meetings
Technical Activities
Tutorial & Education
Standards
Communications
Standing Committees
Industry Advisory Board
Activities
Board Test
Defect Tolerance
Economics of Test
Embedded Core Test
FPGA Test
Freeware Libraries
IEEE 1149.1 Access
Hardware Security and Trust
High Level D&T
IDDQ Testing
Infrastructure IP
MCM Testing
Memory Test
MEMS Testing
Mixed Signal Test
Nanometer Testing
Nano-based Devices
Network-On-Chip Test
On-line Test
Power-Aware Testing
RF Test
Silent Data Corruption
Silicon Debug and Diagnosis
Students Activities
System Test
3D chips and SiP Testing
Test Compression
Test Education
Test Resource Partitioning
Test Synthesis
Thermal Test
Verification and Test
Meetings
Conferences
Symposia
Workshops
Standards
Worldwide
Asia and Pacific
India
Europe
Latin America
North America
Middle East and Africa
Awards
TTTC Lifetime Contribution Medal
TTTC Service Awards
ITC/TTTC GERALD W. GORDON AWARD FOR STUDENT VOLUNTEER SERVICES
TTTC NAVEENA NAGI AWARD
THE TTTC JAMES BEAUSANG STUDENT AWARD FOR DFT
TTTC Jan Hlavicka Memorial Award
TTTC’s E. J. McCluskey Doctoral Thesis Award
TTTC Bob Madge Innovation Award
TTTC JETTA Best Paper Award
EBS
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
Standards
IEEE 1450.1
October 21, 2014
Extensions to STIL for Semiconductor Design Environment
Tony TAYLOR,
t.taylor@ieee.org
Previous:
IEEE 1450.2-2002
Next:
IEEE 1450-1999
