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27th IEEE International Symposium on On-Line Testing and Robust System Design
(IOLTS 2021)
June 28th - 30th, 2021



Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based.

The International Symposium on On-Line Testing and Robust System Design (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and by the IEEE Computer Society Test Technology Technical Council (TTTC). The 2021 edition is organized by the Politecnico di Torino, the University of Athens, the TIMA Laboratory, and iRoC Technologies.

The topics of interest include (but are not limited to) the following ones:
  • Dependable system design
  • Dependable Computer Architectures
  • Design-for-Reliability
  • Design for Reliability approaches for Low-Power
  • Cross-layer reliability approaches
  • Fault-Tolerant and Fail-Safe systems
  • Functional safety
  • Self-Test and Self-Repair
  • Self-Healing design
  • Self-Regulating design
  • Self-Adapting design
  • Reliability issues of Low-Power Design
  • Robustness evaluation
  • Quality, yield, reliability and lifespan issues in nanometer technologies
  • Variability, Aging, EMI, and Radiation Effects in nanometer technologies
  • On-line testing techniques for digital, analog and mixed-signal circuits
  • Self-checking circuits and coding theory
  • On-line monitoring of current, temperature, process variations, and aging
  • Power density and overheating issues in nanometer technologies
  • Field Diagnosis, Maintainability, and Reconfiguration
  • Design for Security
  • Fault-based attacks and counter measures
  • Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications
  • CAD for robust circuits design


Regular papers

The IOLTS Program Committee invites original, unpublished and not currently under review submissions for IOLTS 2021.

Submissions are accepted through the IOLTS website:

Submitted papers must be complete manuscripts, up to six pages (the references do not count towards the page limit) in a standard IEEE two-column format. Papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.

Proposals for special sessions

Proposals for special sessions are also welcomed. Special sessions may include presentations on hot topics, panels, embedded tutorials. Every proposal must include a 150-to-200 word abstract, the name of the organizers and a list of at least three speakers with a tentative presentation title that should be submitted by email to the program chairs (

If the proposal for the special session is accepted, the speakers will be invited to prepare a paper to be included in the formal proceedings of the conference.

Key Dates

Submission deadline: March 30th, 2021

Notification of acceptance: May 12th, 2021

Camera Ready: June 7th, 2021

Symposium: June 28th.30th, 2021

Additional Information

For information regarding paper submission contat the IOLTS 2021 Program Co-Chairs

Dimitris Gizopoulos

University of Athens Athens, Greece

Tel: +30 210 7275145


Dan Alexandrescu

iRoC Technologies

Grenoble, France

Tel: +33 (0) 4 38 12 07 63


For general information please contat the IOLTS 2021 General Co-Chairs

Stefano Di Carlo

Politecnico di Torino

Tel: +39 011 090 7080


Michael Nicolaidis

TIMA Laboratory

Grenoble, FranceTel:+33(0)476574696

For more information, visit us on the web at:

IEEE is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

IEEE Computer Society-Test Technology Technical Council

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