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TTTC's Electronic Broadcasting Service |
17th IEEE Workshop on Silicon Errors in Logic System Effects
DEADLINE EXTENDED TO JANUARY 19th, 2021 |
CALL FOR PAPERS
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The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and also for large scale servers and high performance applications. In the context of space and automotive applications the rapid market evolution and the increase in complexity of the electronic devices call for new methodologies to verify and increase the reliability of current and future COTS products. The SELSE workshop provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome. We are happy to announce that the best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2021. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Taipei, Taiwan on June 21 – June 24, 2021. Key areas of interest include (but are not limited to):
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Additional information and guidelines for submission are available at http://www.selse.org. Submissions and final papers should be PDF files following the IEEE two-column transactions format with six or fewer printed pages of text; the bibliography does not count against this page limit. Papers are not published through IEEE/ACM nor archived in the digital libraries---however, they are distributed to attendees of the workshop. |
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Additional Information | |
General Co-Chairs: Paolo Rech <prech@inf.ufrgs.br> Stefano Di Carlo <stefano.dicarlo@polito.it> Program Co-Chairs: Guan, Qiang <qguan@kent.edu> Carles Hernandez Luz <carherlu@upv.es> |
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Committee | |
General Co-Chairs
Program Co-Chairs
Finance Chair
Registration Chair
Local Arrangements Chair
Publicity Co-Chairs
Bay Area Industry Liaisons
Webmaster
Advisors to the Committee
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For more information, visit us on the web at: http://www.selse.org |
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SELSE 2021 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society-Test Technology Technical Council |
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