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17th IEEE Workshop on Silicon Errors in Logic – System Effects
(SELSE 2021)
April 21 – April 22, 2021
UCLA University, USA or Virtual, depending on the evolving of the pandemic




The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and also for large scale servers and high performance applications. In the context of space and automotive applications the rapid market evolution and the increase in complexity of the electronic devices call for new methodologies to verify and increase the reliability of current and future COTS products.  

The SELSE workshop provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome.

We are happy to announce that the best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2021. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Taipei, Taiwan on June 21 – June 24, 2021.

Key areas of interest include (but are not limited to):

  • Error rates and trends in current and emerging technologies, including experimental failure data and characterization of deployed systems.
  • New error mitigation techniques, robust software frameworks, and error handling protocols for resilient system design.
  • New approaches to the robustness verification of complex safety-critical systems hardware and software platforms
  • Case studies analyzing the overhead, effectiveness, and design complexity of error mitigation techniques.
  • Resilience characterization and strategies for machine learning applications, including autonomous vehicles.
  • Resilience in new architectures, for example accelerator-rich systems and inexact or approximate computing.
  • The design of resilient systems for space exploration.
  • The interplay between system security issues and reliability.
  • Error model on quantum computer in NISQ  era.
  • Error tolerant algorithms and design for quantum computing


Additional information and guidelines for submission are available at  Submissions and final papers should be PDF files following the IEEE two-column transactions format with six or fewer printed pages of text; the bibliography does not count against this page limit. Papers are not published through IEEE/ACM nor archived in the digital libraries---however, they are distributed to attendees of the workshop.

Key Dates

  • Abstract Submission (mandatory): January 19th, 2021 (EXTENDED)
  • Full Paper Submission :  January 19th, 2021 (EXTENDED)
  • Author Notification: March 01, 2021
  • Camera-Ready Submission: March 24, 2021
Additional Information

General Co-Chairs:

Paolo Rech <>

Stefano Di Carlo <>

Program Co-Chairs:

Guan, Qiang <>

Carles Hernandez Luz <>


General Co-Chairs

  • Paolo Rech, UFRGS
  • Stefano Di Carlo, Politecnico di Torino
  • Laura Monroe, LANL (Emerita)
  • John Daly, LPS (Emeritus)

Program Co-Chairs

  • Qiang Guan, Kent State
  • Carles Hernández, UPV

Finance Chair

  • Marcelo Brandalero, Brandenburg University of Technology Cottbus-Senftenberg

Registration Chair

  • Karthik Swaminathan, IBM

Local Arrangements Chair

  • Irina Alam, UCLA

Publicity Co-Chairs

  • Michael Sullivan, NVIDIA (North America)
  • Tiago Balen, UFRGS (South America)
  • Stefano Di Carlo, PoliTo (Europe)
  • Yi-Pin Fang, TSMC (Asia)

Bay Area Industry Liaisons

  • Shahrzad Mirkhani, Bigstream
  • Mark Gottscho, Google


  • Vanessa Job, LANL/UNM
  • Daniel Oliveira, UFPR

Advisors to the Committee

  • Sarah Michalak, LANL
  • Alan Wood, Oracle
  • Vilas Sridharan, AMD
For more information, visit us on the web at:

SELSE 2021 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

IEEE Computer Society-Test Technology Technical Council

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