TTTC's Electronic Broadcasting Service
38th IEEE VLSI Test Symposium 2020
CALL FOR PARTICIPATION
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, reliability and security of microelectronic circuits and systems.
|Due to COVID-19 we have been forced to turn VTS 2020 into a virtual conference.
Nevertheless, even if we miss the pleasure of the face to face interaction, thanks to the whole VTS community, we have been able to build and incredible rich program that includes:
The detailed program is available at: http://tttc-vts.org/public_html/new/2020/
VTS 2020 will officially open on April 27th.
To be able to access the conference proceedings, follow video and audio presentations, give feedbacks to the authors, post questions in the forum, rate all presentations and stay in contact with the test community in this difficult virtual life, we encourage you to register to the virtual conference.
Very appealing rates are proposed for program participants that are just attending the virtual meeting.
Don’t miss the opportunity to join the event and discuss with all the experts in the field!!!
L. Anghel and A. Majumdar
(VTS General Chairs)
S. Di Carlo and P. Song
(VTS Program Chairs)
Registrations as virtual attendee are accepted until May 31th, 2020 through the VTS website:
Registered users have access for a period of 10 months to:
For general information:
For submission-related information:
For more information, visit us on the web at: http://www.tttc-vts.org
The 38th IEEE VLSI Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society-Test Technology Technical Council
TTTC 1ST VICE CHAIR
TEST WEEK COORDINATOR
TUTORIALS AND EDUCATION
MIDDLE EAST & AFRICA
PRESIDENT OF BOARD
SENIOR PAST CHAIR
TTTC 2ND VICE CHAIR
ASIA & PACIFIC
INDUSTRY ADVISORY BOARD
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