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38th IEEE VLSI Test Symopsium |
CALL FOR PARTICIPATION |
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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, reliability and security of microelectronic circuits and systems. |
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The core of VTS 2020, three days technical program, responds to many trends and challenges in the semiconductor design and manufacturing industries, with papers and presentations in the research paper sessions covering the core set of test topics: Analog, Mixed-Signal; Hardware Security and Trust; Design Verification, Validation and Diagnosis; Delay & Performance Test; Test ATPG & Compression; On-Line Test & Error Correction; Embedded Systems & Board Test; Learning Based Diagnosis, Test and Security; Test Standards and Scan Test; Structural and Cell Aware Test; 2.5D, 3D and SiP Test. In the framework of a new partnership with the China Test Conference (CTC) a session is dedicated to the presentation of three CTC best papers. VTS also hosts the E.J. McCluskey Doctoral Thesis Competition to showcase exciting student research spanning all of the above topics. VTS continues its tradition of drawing leading test practitioners and researchers in both industry and academia to contribute to the innovative practices (IP), special sessions, and new topic sessions, making it the venue where future technology trends and test challenges are debated, test practices are shared, and test research roadmaps are charted. The social program at VTS provides an opportunity for informal technical discussions among participants. |
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Advance registrations are accepted until March 16th, 2020 through the VTS website: Hotel reservation is possible here: |
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Additional Information | |
For general information: GENERAL CHAIR
For submission-related information: PROGAM CO-CHAIRS
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Committee | |
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For more information, visit us on the web at: http://www.tttc-vts.org |
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The 38th IEEE VLSI Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society-Test Technology Technical Council |
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