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TTTC's Electronic Broadcasting Service |
Fifth IEEE International Workshop on Automotive Reliability & Test
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CALL FOR SUBMISSIONS
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The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable operation of electronics in safety-critical domains is still a major challenge. This edition of the ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society. You are invited to participate and submit your contributions to the ART Workshop. The workshop’s areas of interest include (but are not limited to) the following topics:
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The Workshop asks for the submission of Extended Abstracts of maximum two pages; camera-ready version can be extended up to 4 pages. Detailed submission instructions can be found at the Workshop’s website: http://ART.tttc-events.org. All submissions will be evaluated for selection with respect to their suitability for the workshop, originality, technical soundness, and presented results. Selected submissions can be accepted for regular or short presentation at the Workshop. The workshop will make available to all participants an Electronic Workshop Digest, which includes all material that authors are willing to provide: abstract, paper, poster, etc. The best contributions to ART 2020 will be invited to submit a full version to the ART special issue hosted by the Elsevier Microelectronic Reliability journal. |
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| Additional Information | |
Yervant Zorian – General Chair Paolo Bernardi – Program Chair |
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| Committee | |
M. Abdelwahid - Mentor Graphics |
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| For more information, visit us on the web at: http://art.tttc-events.org/ |
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The CONFERENCE is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society-Test Technology Technical Council |
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