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IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis |
CALL FOR PARTICIPATION | |
Scope | |
Every year, we revisit the scope of the DATA workshop to capture emerging issues, but the common theme has always been DATA, specifically, semiconductor test and yield data. We need to not only measure and collect data, but also to process the data appropriately for yield analysis. The data can come from a variety of source, including test sort & fail bins, in-line defect inspection, test measurements, memory bitmapping, scan diagnosis, and physical failure analysis. There is a need to aggregate, overlay, and cross-correlate the data from these various sources in a way that allows efficient yield learning and enables a speedy production ramp. | |
Keynote Speaker: John Kibarian, CEO, PDF Solutions Distinguished Speaker: Mike Campbell, Sr. VP, Qualcomm
Paper presentations: 8 papers on different topics For detailed information please visit: http://data.tttc-events.org/ | |
For registration and accommodation please visit: http://data.tttc-events.org/ | |
| Additional Information | |
Technical Program Submissions: Jennifer Dworak Southern Methodist University, USA. E-mail: jdworak@lyle.smu.edu General Information: Arani Sinha Intel, USA. E-mail: Arani.Sinha@INTEL.com | |
| Committee | |
GENERAL CHAIR Arani Sinha, Intel PROGRAM CHAIR Jennifer Dworak, SMU VICE-PROGRAM CHAIR Wesley Smith, Galaxy FINANCE CHAIR Sankaran Menon, Intel PUBLICITY CHAIR Kanad Chakraborty, Intel PUBLICATIONS CHAIR Chintan Patel, UMBC LOCAL ARRANGEMENTS CHAIR David Park, OptimalPlus TEST STANDARDS CHAIR Al Crouch, ASSET InterTech EU LIAISON Paul Simon, Qualtera STEERING COMMITTEE Jeffrey Roehr, Texas Instruments Sankaran Menon, Intel Adit Singh, Auburn Univ. M. Tehranipoor, U Connecticut Hank Walker, Texas A&M Hans Manhaeve, Q-Star Test Jim Plusquellic, U. New Mexico PROGRAM COMMITTEE Rob Aitken, ARM Nemat Bidokhti, Cisco Sreejit Chakravarty, Intel John Carulli, GlobalFoundries Patrick Girard, LIRMM, France Ajay Khoche, Consultant Mike Laisne, Qualcomm Amit Nahar, TI Suriyaprakash Natarajan, Intel Jay Orbon, Consultant John Potter, Asset-Intertech Rajesh Raina, Freescale Claude Thibeault, ETS, Canada Li C. Wang, UCSB Xiaoqing Wen, KIT, Japan Qiang Xu, CUHK, Hong Kong | |
For more information, visit us on the web at: http://DATA.tttc-events.org/ | |
The IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). | |
IEEE Computer Society- Test Technology Technical Council | ||
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