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Fourth IEEE INTERNATIONAL WORKSHOP ON AUTOMOTIVE RELIABILITY & TEST
EXTENDED DEADLINE September 16, 2019
CALL FOR PAPERS
The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions.
With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable operation of electronics in safety-critical domains is still a major challenge. This edition of the ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.
ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society.
* Functional safety and security in the automotive domain
* Automotive standards and certification – ISO 26262
* Approximate computing and Artificial Intelligence
* Multi-layer dependability evaluation
* Verification and validation of automotive systems
* Fault tolerance and self-checking circuits
* Aging effects on automotive electronics
* Resiliency by application
* Dependability challenges of autonomous driving and e-mobility
* Power-up, power-down and periodic test
* System level test
* Built-In Self-Test (BIST and SBIST) in automotive systems
* Reuse of test infrastructure
* Functional and structural test generation
* High quality volume test and minimizing DPPM
* Life cycle test cost minimization
Submissions must be sent in as PDF file. The Workshop prefers Full Paper submissions (of up to six pages), but also allows Extended Abstract submissions (of at least two pages). Detailed submission instructions can be found at the Workshop’s website: http://ART.tttc-events.org.
All submissions will be evaluated for
selection with respect to their suitability for the workshop, originality, technical soundness, and presented results. Selected submissions can be accepted for regular or poster presentation at the Workshop.
PUBLICATIONS – The workshop will make available to all participants an Electronic Workshop Digest, which includes all material that authors are willing to provide: abstract, paper, slides, poster, etc
* Submission deadline : SEPTEMBER 16, 2019 (EXTENDED)
* Notification of acceptance : SEPTEMBER 28, 2019
* Camera-ready material : OCTOBER 12, 2019
For further information, please, contact:
YERVANT ZORIAN – General Chair
PAOLO BERNARDI – Program Chair
Politecnico di Torino
M. Abdelwahid – Mentor Graphics
R. Arnold – Infineon Technologies
N. Bishnoi – Globalfoundries
G. Boschi – Intel Corporation
A. Cron – Synopsys
W. Dobbelaere – On Semiconductor
C. Eychenne – Bosch
K. Greb – NVIDIA Corp
A. Hales – Texas Instruments
P. Harrod – ARM Ltd
R. Montino – Elmos Semi
N. Mukherjee – Mentor Graphics
R. Parekhji – Texas Instruments
A. Priore – Arm
P. Rech – UFRGS
E. Sanchez – PoliTo
M. Sauer – Advantest Europe
A. Singh – Auburn U.
M. Skillinsky – NXP
R. Srinivasan – NVIDIA Corp
C. Suresh – TSMC
D. Tille – Infineon Tech.
F. Venini – Xilinx
H.M. von Staudt – Dialog Semi
M. Wahl – Siegen U.
J. Yi – AMD
For more information, visit us on the web at: http://ART.tttc-events.org
IEEE Computer Society-Test Technology Technical Council
TTTC 1ST VICE CHAIR
TEST WEEK COORDINATOR
TUTORIALS AND EDUCATION
MIDDLE EAST & AFRICA
PRESIDENT OF BOARD
SENIOR PAST CHAIR
TTTC 2ND VICE CHAIR
ASIA & PACIFIC
INDUSTRY ADVISORY BOARD
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