TTTC's Electronic Broadcasting Service
7th IEEE International Workshop on
Silicon Debug and Diagnosis
Immediately following the 2011 International Test Conference
CALL FOR PARTICIPATION
Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work is however very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market. New and efficient solutions for debug and diagnosis have a much needed and highly visible impact on productivity.
SDD 2011 will be held in Anaheim, California, USA. It is the seventh of a series of highly successful technical workshops that consider issues related to debug & diagnosis of semiconductor circuits and systems - from prototype bring-up to volume production.
For general information contact:
For program information contact:
For more information, visit us on the web at: http://www.sdd-online.org
The 7th IEEE International Workshop on Silicon Debug and Diagnosis (SDD 2011 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC