IOST3 2006 - Call for Participation

ONLINE REGISTRATION IS NOW AVAILABLE AT: https://www.cemamerica.com/vts2007/
Advance Registration Rates End April 23, 2007

CALL FOR PARTICIPATION

The IOST3 workshop supports a community of practice focused on open source and open interface tools for test, quality assurance, and reliability estimation of electronic devices, assemblies, and systems.

This year's Workshop will focus on data management – test vector standards, datalogs, validation and analytical tools, and particularly on the aggregation and correlation of data from disparate sources that effective collaboration can provide. Design data for IC's, subassemblies, and systems, failure and repair reports, and production equipment histories all play a role in identifying root causes and improving reliability. The warp and woof of collaboration and competition create the fabric of civilization's progress, and the Open Source milieu has been found to provide a dramatic new means to facilitate that progress. IOST3 is exploring that milieu for the benefit of semiconductor and system test in a worldwide community.

IOST3 Preliminary Schedule Claremont Resort and Spa, Berkeley CA Wednesday, May 9, 2007
4:00 pm	Welcome Burnell West, IOST3 General Chair
4:15 pm	Program Introduction Scott Davidson, Sun Microsystems, Program Chair
4:30 pm	Keynote Address Paul Muray, Sun Microsystems
5:15 pm	Open Discussion
6:15 pm WINE & CHEESE RECEPTION
Thursday, May 10, 2007
7:30 am REGISTRATION & CONTINENTAL BREAKFAST
8:00 am	Session 2: Open Source Information for ICs
8:00 am	Device, Subassembly, and System Data Structures for Test and Reliability B. West
8:30 am	Comparative Mixed-signal Test Method and Toolset A. Mellik, J. Raik - Tallinn University of Technology
9:00 am	Globally Optimized Robust Systems Research:Open Source Tools and Techniques S. Mitra - Stanford Univ.
9:30 am	An Extensible Evolutionary-based General-purpose Optimizer E. Sanchez, M. Schillaci, G. Squillero - Politecnico di Torino
10:00 am BREAK
10:30 am	Session 3: Open Source Standards
10:30 am	STIL Progress and Common STIL Tools T. Taylor
11:00 am	IEEE 1500 Compliant Self-Test Design Library D. Appello - STM; P. Bernardi, M. Grosso, W. Sanchez, M. Sonza Reorda, J Lagos-Benites - Politecnico di Torino
2:00 pm	Standardizing Fail datalog format for Volume Diagnostics Ajay Khoche - Verigy
12:00 noon LUNCH
3:00 pm	Session 4: Managing Data for Quality
1:30 pm	Shared Analysis of system level data speeds diagnosis of ASIC NTFs M. Kamm - Cisco
2:00 pm	Guitar: A Visualization Tool for Returns and Other Information S. Davidson, A. Hale - Sun Microsystems
2:30 pm	Test Technology Collaboration Consortium B. Price - NXP Semiconductors
3:00 pm BREAK
3:30 pm	Wrap-up Discussion

For more information, visit us on the web at: http://iost3.org/

The IOST3 2007: IEEE International Workshop on Open Source Test Technology Tools is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	IOST3 - 2007: IEEE INTERNATIONAL WORKSHOP on OPEN SOURCE TEST TECHNOLOGY TOOLS May 9-10, 2007 Berkeley, California Held in conjunction with IEEE VLSI Test Symposium (VTS-07) http://IOST3.org/