IMSTW 2006 - Call for Participation

CALL FOR PARTICIPATION

Registration deadline for Reduced Rates: May 19th, 2006

Registration is now open for the 2006 IEEE International Mixed-Signals Testing Workshop (IMSTW). Thirty-eight papers and posters have been accepted for presentation at the workshop covering the areas of:

Analogue Test
MEMS test
RF test
Self-Tuning, Calibration & Correction
Data converters test
Mixed-Signal Test & Fault Tolerance
Signal Integrity & Jitter

The workshop will also feature keynote and guest presentations from industry experts, a panel discussion and for the social program, events including whisky tasting, and a banquet in Edinburgh Castle.

Practitioners working in the fields of Micro & Nano Technology, Electronic System Design, Integrated Microsystems and System on Chip Engineering are all encouraged to participate. The event historically attracts both industrial and academic delegates providing an ideal environment for sharing best practice, initiating collaboration and gaining awareness of the new methods, crucial to the manufacturability of future highly integrated electronic, optical, bio-chemical and MEMS based systems featuring micro & nano technologies.

Delegates are encouraged to register early through the web-site (www.sli-institute.ac.uk/imstw06/) to benefit from reduced rates and to ensure that they book accommodation well in advance as the workshop is being held at an extremely busy time of year in the Scottish Capital.

The venue is the Sheraton Grand Hotel & Spa in Edinburgh City Centre, Scotland. The hotel is located only a few minutes from the historical Edinburgh Castle and the Royal Mile with its 13th century cathedral and numerous sites of historical significance.

Full details of the program can be found on the web-site together with helpful information regarding accommodation, travel and links to other related mixed signal test resources.

Registration deadline for Reduced Rates: May 19th, 2006

General Information

Prof. Andrew Richardson
Lancaster University
Lancaster, LA1 4YR, UK
Tel.: +44 1524 593018
Fax: +44 1524 592777
E-mail: a.richardson@lancaster.ac.uk

Local Information

Amanda Tanahill
Institute for System Level Integration
Alba Campus, Livingston, EH54 7EG, Scotland
Tel.: + 44 1506 469310
Fax: +44 1506 469301
E-mail: Amanda.Tannahill@sli-institute.ac.uk

Program Information

Prof. Marcelo Lubaszewski
UFRGS Federal University
90035-190 Porto Alegre RS, Brazil
Tel.: +55 51 3316 3516
Fax: +55 51 3316 3293
E-mail : luba@ece.ufrgs.br

Prof. Chau-Chin Su
National Central University
TW-320 Taiwan R.O.C
Tel. : + 886-3-4264209
Fax: + 886-3-4264209
E-mail: ccsu@cn.nctu.edu.tw

For more information, visit us on the web at: http://www.sli-institute.ac.uk/imstw06/

The 12th Annual IEEE International Mixed-Signals Testing Workshop (IMSTW) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).