Category: Standards
The Test Technology Technical Community supports the development and maintenance of several IEEE standards.
The following is an overview of Test Technology standards:
-
Standard for Memory Modeling in Core Test Language (CTL)Saman ADHAM, saman@logicvision.com
-
Extensions to STIL for Core Test Language (CTL) SupportRohit KAPUR, rkapur@synopsys.com
-
Extensions to STIL for Analog and Mixed Signal EnvironmentsJean-Louis CARBONERO, jean-louis.carbonero@st.com
-
Embedded Core TestYervant ZORIAN, y.zorian@computer.org
-
In-System Configuration of Programmable DevicesNeil JACOBSON, neil.jacobson@xilinx.com
-
Static Component Interconnection Test Protocol and Architecture (SCITT)Heiko EHRENBERG, h.ehrenberg@goepel.com
-
IJTAGKenneth POSSE, kepos@comcast.netAlfred CROUCH, al.crouch@inovys.com
-
Test Access Architecture for Three-Dimensional Stacked Integrated CircuitsErik Jan Marinissen, erik.jan.marinissen@imec.be