Category: Standards

The Test Technology Technical Community supports the development and maintenance of several IEEE standards.

The following is an overview of Test Technology standards:

  • IEEE P1450.6-2

    Standard for Memory Modeling in Core Test Language (CTL)Saman ADHAM,

  • IEEE 1450.6-2005

    Extensions to STIL for Core Test Language (CTL) SupportRohit KAPUR,

  • IEEE P1450.7

    Extensions to STIL for Analog and Mixed Signal EnvironmentsJean-Louis CARBONERO,

  • IEEE 1500

    Embedded Core TestYervant ZORIAN,

  • IEEE 1532

    In-System Configuration of Programmable DevicesNeil JACOBSON,

  • IEEE P1581

    Static Component Interconnection Test Protocol and Architecture (SCITT)Heiko EHRENBERG,

  • IEEE P1687

    IJTAGKenneth POSSE, kepos@comcast.netAlfred CROUCH,

  • IEEE P1838

    Test Access Architecture for Three-Dimensional Stacked Integrated CircuitsErik Jan Marinissen,