Category: Standards

The Test Technology Technical Community supports the development and maintenance of several IEEE standards.

The following is an overview of Test Technology standards:

  • IEEE P1450.6-2

    Standard for Memory Modeling in Core Test Language (CTL)Saman ADHAM, saman@logicvision.com

  • IEEE 1450.6-2005

    Extensions to STIL for Core Test Language (CTL) SupportRohit KAPUR, rkapur@synopsys.com

  • IEEE P1450.7

    Extensions to STIL for Analog and Mixed Signal EnvironmentsJean-Louis CARBONERO, jean-louis.carbonero@st.com

  • IEEE 1500

    Embedded Core TestYervant ZORIAN, y.zorian@computer.org

  • IEEE 1532

    In-System Configuration of Programmable DevicesNeil JACOBSON, neil.jacobson@xilinx.com

  • IEEE P1581

    Static Component Interconnection Test Protocol and Architecture (SCITT)Heiko EHRENBERG, h.ehrenberg@goepel.com

  • IEEE P1687

    IJTAGKenneth POSSE, kepos@comcast.netAlfred CROUCH, al.crouch@inovys.com

  • IEEE P1838

    Test Access Architecture for Three-Dimensional Stacked Integrated CircuitsErik Jan Marinissen, erik.jan.marinissen@imec.be