2011 Finals held at International Test Conference (ITC)

Session Chair: Ilia Polian

1. Wing Chiu Tam (Shawn Blanton, Carnegie Mellon University)

   Title: Physically-Aware Analysis of Systematic Defects in Integrated Circuits

• Guihai Yan (Xiaowei Li, ICT Beijing)

  Title: Online Timing Variation Detection and Tolerance for Digital Integrated Circuits

• Urban Ingelsson (Bashir Al-Hashimi, University of Southampton, UK)
  Title: Investigation into Voltage and Process Variation-Aware Manufacturing TestJury members:

  Victor Champac (INAOEP, Mexico)

  Prof. Tim Cheng (UC Santa Barbara, USA)

  Prof. Kazumi Hatayama (NAIST, Japan)

  Prof. Hans Kerkhoff (University of Twente, Netherlands)

  Prof. Sule Ozev (Arizona State University, USA)

  Dr. Anne Gattiker (IBM)

  Dr. Martin Keim (Mentor Graphics)

  Dr. Bharath Seshadri (Nvidia)

  Dr. Erik Volkerink (Verigy)

  ATS 2010 semi-finals (counts towards BDT 2011):

  Local coordinator: Huawei Li

  1. Guihai Yan (Xiaowei Li, ICT Beijing)

     Title: Online Timing Variation Detection and Tolerance for Digital Integrated Circuits

• Xiao Liu (Qiang Xu, Chinese Univ. of HongKong)

  Title: Trace-Based Post-Silicon Validation and Compression-Aware Test Power Reduction for VLSI Circuits

• Zhiyuan He (Zebo Peng, Petru Eles, Linköping University)

  Title: Temperature Aware and Defect-Probability Driven Test Scheduling for System-on-Chip
  Jury members:

  Huawei Li (Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China)

  Shi-Yu Huang (National Tsinghua U., Taiwan)

  Satoshi Ohtake (NAIST, Japan)

  Qiang Xu (Chinese University of Hong Kong, Hongkong)

  Virendra Singh (Indian Institute of Science (IISc), Bangalore, India)

  Robert Aitken (ARM, US)

  Wu-Tung Cheng (Mentor Graphics, US)

  Kazumi Hatayama (STARC, Japan)

  Erik Jan Marinissen (IMEC, Belgium)

  Srikanth Venkataraman (Intel, US)

  VTS 2011 semi-finals:

  Local coordinator: Shobha Vasudevan

  Session Chair: Jennifer Dworak

  1. Wing Chiu Tam (Shawn Blanton, Carnegie Mellon University)

     Title: Physically-Aware Analysis of Systematic Defects in Integrated Circuits

• Aswin Sreedhar (Sandip Kundu, UMass Amherst)

  Title: Managing Lithographic Variations in Design, Reliability and Test Using Statistical TechniquesJury members:

  Vishwani Agrawal (Auburn Univ.)

  Janak Patel (Univ. Illinois Urbana Champaign)

  Adit Singh (Auburn Univ.)

  Nur Touba (UT Austin)

  Magdy Abadir (Freescale)

  Dilip Bhavsar (Intel)

  Yervant Zorian (Synopsys)

  ETS’11 semi-finals winners:

  Local coordinator: Ilia Polian

  1. Urban Ingelsson (Bashir Al-Hashimi, University of Southampton, UK)

     Title: Investigation into Voltage and Process Variation-Aware Manufacturing Test

• Esa Korhonen (Juha Kostamovaara, University of Oulu, Finland)

  Title: On-chip Testing of A/D and D/A Converters. Static Linearity Testing without Statistically Known Stimulus

• Viacheslav Izosimov (Zebo Peng, Petru Eles, Linkoping University, Sweden)
  Title: Scheduling and Optimization of Fault-Tolerant Distributed Embedded Systems
  Jury members:

  Sandeep Gupta (USC, USA)

  Michel Renovell (LIRMM, France)

  Jerzy Tyszer (TU Poznan, Poland)

  Xiaoqing Wen (Kyushu Institute of Technology, Japan)

  Peter Maxwell (Aptina, USA)

  Grezegorz Mrugalski (Mentor Graphics, Poland)

  Frank Pohl (Intel Mobile, Germany)