TTTC’s interests encompass a wide variety of technologies, since each area in electronic test depends on its own specialized instrumentation and techniques.
A number of technologies are usually needed to test a single product thereby increasing the challenge. TTTC’s current scope includes, but is not limited to:
- Testing of analog, digital, memory, FPGA, SiP, and RF Semiconductor circuits
- Testing of embedded cores, integrated circuits, MCMs, boards and systems
- Testability methods: built-in self-test, scan, and test synthesis
- Verification and Validation
- Embedded Test, ATE, Test resource partitioning
- Yield Optimization, defect/fault tolerance and embedded repair methodologies
- Infrastructure IP
- On-line, IDDQ, thermal testing
- Transient faults, soft errors, robustness, field reliability
- Debug and Diagnosis
|
