 |
TTTC's Electronic Broadcasting Service |
18th IEEE Workshop on Silicon Errors in Logic System Effects
|
|
CALL FOR PAPERS
|
|||||||||||||||
The growing complexity and shrinking geometries of modern semiconductortechnologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, manufacturing defects, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and for large-scale distributed computing. Rapid market evolution and the increase in complexity of electronic devices call for new methodologies to characterize, understand, and improve the reliability of current and future COTS products. The SELSE workshop provides a unique forum for discussion of current research and practice in error detection, root-cause analysis, and mitigation in computing systems. SELSE solicits papers that address the effects of errors from a variety of hardware, software, and operational perspectives: diagnostic, computational, architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome. We are happy to announce that the best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2022. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Baltimore, Maryland, USA, on June 27-30, 2022. Key areas of interest include (but are not limited to):
|
|||||||||||||||
Additional information and guidelines for submission are available at http://www.selse.org. Submissions and final papers should be PDF files following the IEEE two-column transactions format. The allowed page limit is fixed to six; the bibliography does not count towards the page limit. Papers are not published through IEEE/ACM nor archived in the digital libraries – however, they are distributed to the workshop attendees. |
|||||||||||||||
|
|||||||||||||||
| Additional Information | |||||||||||||||
All questions about submissions should be emailed to the general chairs or the program chairs Paolo Rech (prech@inf.ufrgs.br) Stefano Di Carlo (stefano.dicarlo@polito.it) Peter Hochschild (phoch@google.com) Marcello Traiola (marcello.traiola@inria.fr) |
|||||||||||||||
| Committee | |||||||||||||||
|
|||||||||||||||
| For more information, visit us on the web at: https://selse.org/ |
|||||||||||||||
SELSE 2022 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
|||||||||||||||
IEEE
Computer Society-Test Technology Technical Council |
||
TTTC CHAIR
PAST CHAIR
TTTC 1ST VICE CHAIR
SECRETARY TEST WEEK COORDINATOR TUTORIALS AND EDUCATION STANDARDS EUROPE MIDDLE EAST & AFRICA STANDING COMMITTEES ELECTRONIC MEDIA |
PRESIDENT OF BOARD SENIOR PAST CHAIR TTTC 2ND VICE CHAIR FINANCE TECHNICAL MEETINGS TECHNICAL ACTIVITIES ASIA & PACIFIC LATIN AMERICA NORTH AMERICA COMMUNICATIONS INDUSTRY ADVISORY BOARD |
|
This message contains public information only. You are invited to copy and distribute it further. For more information contact the TTTC office or visit http://tab.computer.org/tttc/ To remove or modify your contact information, or to register new users, please click here and follow the on-line instructions. |