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TTTC's Electronic Broadcasting Service |
Workshop on RTL and High Level Testing 2020
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CALL FOR PAPERS
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The purpose of this workshop is to bring researchers and practitioners of LSI testing from all over the world together to exchange ideas and experiences in register transfer level (RTL), high level and system level testing. WRTLT 2020, the twenty-first workshop, will be held in conjunction with the 29th Asian Test Symposium (ATS 2020) as a virtual event. The workshop aims to encourage the presentation and discussion of truly innovative and ”out-of-the-box” ideas aimed at addressing the challenges of high level test. We hope and expect this workshop will provide an ideal forum for discussion on this important topic for future system-on-a-chip (SoC) devices. Original papers on, but not limited to, the following areas are invited.
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Authors are invited to submit paper proposals for presentation at the workshop. The proposal may be an extended summary (1,000 words) or a full paper (4-6 pages, two columns). The submission should include title, full name, and affiliation of all authors, 50 words abstract, keywords and the name of contact author, in a standard IEEE two-column format. All submissions are now to be made electronically through the Easy Chair conference system (https://easychair.org/conferences/?conf=wrtlt2020). Digest of Papers will be handed out at the workshop. The submission will be considered evidence that upon acceptance the author(s) will present the paper at the virtual workshop through pre-recorded videos. |
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| Additional Information | |
Keynote Speech Title: Using System Level Test to screen Automotive products: test the IC in the system before the system tests your IC Speaker: Dr. Davide Appello (STMicroelectronics) Biography: Dr. Davide Appello holds a degree in Electronics Engineering from the Alma Ticinensis Universitas, at Pavia, Italy. He is with STMicroelectronics since 1994 where he is concerned with testability and testing and is currently product engineering and business operations director for the automotive digital solutions division. His main interests include the screening process in the IC industry for automotive components, test economics, testability, reliability and diagnostic. |
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| For more information, visit us on the web at: https://www.ieee-wrtlt.org/2020/ |
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The CONFERENCE is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society-Test Technology Technical Council |
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