TTTC's Electronic Broadcasting Service |
39th IEEE VLSI Test Symposium
|
CALL FOR PAPERS
|
|
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability and security of microelectronic circuits and systems. The 2021 edition of VTS will be an online virtual interactive live event. The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions and Innovative Practices sessions. Given the unique opportunity of reaching the worldwide test community through a virtual event registration rate for most authors and attendees will be a fraction of our registration rate for VTS’20. You are invited to participate and submit your contributions to VTS’21. The areas of interest include (but are not limited to) the following topics:
New hot topics: VTS puts particular emphasis on enlarging its scope soliciting submissions on aspects on the following hot topics:
|
|
The VTS Program Committee invites original, unpublished submissions in the following categories:
All submissions must be submitted electronically through the VTS website. A submission will be considered as evidence that, upon acceptance, the author(s) will submit a final camera-ready version of the paper. Registration of at least one author by the camera-ready deadline and presentation of the paper at the symposium are also required for inclusion of the paper in the published proceedings. NEWS!!!!. Starting from 2021 VTS review process for both scientific papers and industrial application short papers is DOUBLE BLIND with REBUTTAL. The page limit excludes the Bibliography. Do not include any author names on any submitted documents except in the space provided on the submission form. You must also ensure that the metadata included in the PDF does not give away the authors. If you are improving upon your prior work, refer to your prior work in the third person and include a full citation for the work in the bibliography. Authors will be required to answer specific questions from the reviewers in a rebuttal phase before the TPC meeting. |
|
|
|
Additional Information | |
For general information: General Chairs Lorena Anghel (SPINTEC, Grenoble INP) <lorena.anghel@grenoble-inp.fr> Stefano Di Carlo (Politecnico di Torino) <stefano.dicarlo@polito.it> For submission-related information: Program Co-chairs Mehdi Tahoori (KIT) <mehdi.tahoori@kit.edu> Suriyaprakash Natarajan (Intel) <suriyaprakash.natarajan@intel.com>
|
|
Committee | |
Organizing Committee: General Chair:
Ex-Officio:
Steering Committee:
|
|
For more information, visit us on the web at: https://www.tttc-vts.org/ |
|
VTS'21 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society-Test Technology Technical Council |
||
This message contains public information only. You are invited to copy and distribute it further. For more information contact the TTTC office or visit http://tab.computer.org/tttc/ To remove or modify your contact information, or to register new users, please click here and follow the on-line instructions. |