26th IEEE European Test Symposium
(ETS'21)
May 24-28, 2021
Virtual Interactive Event

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, hot topics, and new trends, industrial case-studies and applications, in the area of electronic-based circuits and system testing, reliability, safety, security and validation. The 2021 edition of ETS will be a virtual one. The organizing team will strive to keep the spirit of ETS alive, by organizing an event with live sessions and many opportunities for networking and peer interaction. ETS’21 is organized jointly by KU Leuven and imec, which co-sponsor the event together with the IEEE Council on Electronic Design Automation (CEDA).

The program includes keynotes, scientific paper presentations, panels, tutorials, workshops and highlights/demos from industry. Besides regular technical papers, ETS’21 provides the opportunity of submitting scientific contributions for hot-topic papers and case-study papers (each with specific evaluation criteria). Submissions are also solicited for special sessions, panels, tutorials and workshops, as well as for the PhD Forum. Linked to the main ETS’21 symposium, the Test Spring School and Fringe Workshops will be organized.

You are invited to participate and submit your contributions to ETS’21. The areas of interest include (but are not limited to) the following topics:

• Analog, Mixed-Signal and RF Test
• High-Speed I/0 Test
• Approximate Circuit Testing
• Low-Power Test
• ATE Hardware and Software
• Machine Learning and AI for Test
• Automatic Test Generation
• Memory Test and Repair
• Automotive and Avionics Test
• Microsystems / MEMS / Sensors Test
• Board Test and Diagnosis
• On-Line Test
• Built-In Self-Test
• Power- / Thermal-Aware Test
• Current-Based Test
• Processor Test (Multi-Core, GPU, CPU, Neuromorphic etc.)
• Defect-Based Test
• Security Issues in Test
• Delay and Performance Test
• Self-X (Awareness, Repair, Test, etc.)
• Dependability and Functional Safety
• Signal Integrity Test
• Design for Test
• SoC and NoC Test
• DfX (Design for Manufacturing, Reliability, Yield, etc.)
• Stacked or 3D ICs Test
• Diagnosis and Silicon Debug
• Standards in Test
• Economics of Test
• Test of Reconfigurable Systems (FPGA, CPLD, etc.)
• Failure Analysis
• Test, Reliability and Security of Emerging Technologies
• Fault Modeling and Simulation
• Test, Reliability and Security of Emerging Computing (Neuromorphic, In-Memory, Reversible and Quantum Circuits, etc.)
• Fault Tolerance
• Trojan Detection
• Hardware Security
• Verification and Validation
• Hardware Trust
• Yield Analysis and Enhancement

ETS’21 seeks original, unpublished contributions of the following types:

• Scientific Papers for the Formal Proceedings:
• Regular Papers, presenting novel and complete research work.
• Hot-Topic Papers, presenting early innovative ideas with in-progress results, emerging and future test/reliability/safety problems, or identifying open problems that merit innovative future research.
• Case-Study Papers, presenting relevant industrial (or industrial collaboration) data that demonstrate a previously published concept, or that can help further research advancements.
• PhD Forum Contributions from students eager to discuss their on-going research.
• Proposals for Panels, Embedded Tutorials, Special Sessions and Fringe Workshops.
• Industrial Presentations and Demos focusing on new features of test/reliability/safety-related products.

Submission deadline for title and abstract of scientific papers: December 10th, 2020

Submission deadline for full scientific papers: December 17th, 2020

Submission deadline for PhD Forum, panels, embedded tutorials, special sessions and fringe workshops: January 22nd, 2021

Notification of acceptance: February 12th, 2021

Camera-ready manuscript and author registration: March 15th, 2021

ETS’21 will produce Formal Proceedings of scientific papers with ISBN number that will be included in the IEEE Xplore Digital Library. All accepted technical papers submitted in one of the three categories (regular, hot topic, and case study) will be included in the formal Proceedings (each following its own guidelines). Extended versions of selected papers will be invited for submission in an IEEE Journal Special Issue dedicated to ETS’21.

General Chairs

Georges Gielen (KU Leuven)
<georges.gielen@kuleuven.be>

Program Chair

ETS'21 is sponsored by the IEEE Council on Electronic Design Automation (CEDA), imec and KU Leuven University. IEEE TTTC is a technical co-sponsor