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TTTC's Electronic Broadcasting Service
12th IEEE Workshop on Silicon Errors in Logic System Effects
29-30 March 2016
Austin, TX, USA
CALL FOR PARTICIPATION
The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching. Growing concern about intermittent errors, unstable storage cells, and the effects of aging are influencing system design and failures in memories account for a significant fraction of costly product returns. Emerging logic and memory device technologies introduce several reliability challenges that need to be addressed to make these technologies viable. Additionally, reliability is a key issue for large-scale systems, such as those in data centers and cloud computing infrastructure.
Can the end of Moore’s Law result in new opportunities for computing?
Autonomous car is the new driver for resilient computing and design-for-test.
Quantum error correction and quantum algorithmic discovery
We will have a very interesting panel on the topic of approximate computing with experts from academia and industry. The panel discussion will explore opportunities and challenges of approximate computing in the field of reliability.
SELSE 2016 will feature a "random access" session in which any registered participant (time permitting) may give a very brief talk to highlight some recent advance or issue of interest. The intent is to give the opportunity for an informal platform within the community. Please sign up in advance by filling in the form below. Sign up will also be available during the first day of the workshop.
Registration for the SELSE workshop is now open with early registration ending March 14th, 2016.
Please do not forget to book your hotels early, as the hotel prices can increase closer to the SELSE dates. You can find a list of nearby hotels on the SELSE web page.
Transportation and Local Information:
Austin Industry Liaison:
Local Arrangements Chair:
Advisors to the Committee:
For more information, visit us on the web at: http://www.selse.org
The 12th IEEE Workshop on Silicon Errors in Logic System Effects is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
TTTC 1ST VICE CHAIR
IEEE DESIGN & TEST EIC
ASIA & PACIFIC
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