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Third IEEE International Workshop on Automotive Reliability & Test
SUBMISSION DEADLINE EXTENDED TO September 14, 2018
CALL FOR SUBMISSIONS
The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable operation of electronics in safety-critical domains is still a major challenge. This third edition of the ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.
ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society.
Submission Instructions– Submissions must be sent in as PDF file. The Workshop prefers Full Paper submissions (of up to six pages), but also allows Extended Abstract submissions (of at least two pages). Detailed submission instructions can be found at the Workshop’s website: http://ART.tttc-events.org. All submissions will be evaluated for selection with respect to their suitability for the workshop, originality, technical soundness, and presented results. Selected submissions can be accepted for regular or poster presentation at the Workshop.
Publications– The workshop will make available to all participants an Electronic Workshop Digest, which includes all material that authors are willing to provide: abstract, paper, slides, poster, etc.
Yervant Zorian – General Chair
Paolo Bernardi – Program Chair
Vice General Chair:
Organizing Committee Members:
Panel: T. McLaurin – ARM (US)
Embedded Tutorial: R. Parekhji – TI (IN)
Media Chair: A. Bosio – LIRMM (FR)
Publicity: M. Restifo – POLITO (IT)
O. Ballan Xilinx, US
N. Bishnoi Globalfoundries, IN
G. Boschi Intel, IT
A. Cron Synopsys, US
W. Dobbelaere On Semiconductor, B
P. Engelke Infineon, DE
C. Eychenne BOSCH, FR
D. Gizopoulos Athens University, GR
S.K.Goel TSMC, US
K. Greb NVidia, US
A. Hales Texas Instruments, US
P. Harrod ARM, UK
V. Huard STMicroelectronics, FR
W.-Y. Koe Xilinx, US
R. Mariani Intel, IT
R. Montino Elmos, DE
N. Mukherjee Mentor Graphics, US
A. Priore ARM, UK
P. Rech UFGRS, BR
E. Sanchez Politecnico di Torino, IT
S. Sarangi Nvidia, US
P. Sarson Dialog, UK
M. Schillinsky NXP, DE
R. Srinivasan NVidia, US
D. Tille Infineon, DE
M. Wahl Universität Siegen, DE
H.-J. Wunderlich Stuttgart University, DE
H.M. von Staudt Dialog, DE
For more information, visit us on the web at: http://ART.tttc-events.org
The CONFERENCE is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society-Test Technology Technical Council
TTTC 1ST VICE CHAIR
TEST WEEK COORDINATOR
TUTORIALS AND EDUCATION
MIDDLE EAST & AFRICA
PRESIDENT OF BOARD
SENIOR PAST CHAIR
TTTC 2ND VICE CHAIR
ASIA & PACIFIC
INDUSTRY ADVISORY BOARD
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