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34th IEEE VLSI TEST SYMPOSIUM
CALL FOR PAPERS
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems. Major topics include, but are not limited to:
The VTS Program Committee invites original, unpublished Paper Submissions for VTS 2016. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, and e-mail address of the contact author. A 50- word abstract and five keywords identifying the topic area are also required.
Proposals for the Innovative Practices and Special Sessions tracks are also invited. The innovative practices track highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include invited presentations on hot topics, panels, embedded tutorials. Innovative practices and special session track proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.
VTS 2016 will present a Best Paper Award, a Best Special Session Award, and a Best Innovative Practices Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges. We also plan to organize a Student Poster Competition and a TTTC Best Doctoral Thesis Contest, details for which will be available through the VTS website at a later date. The Best Paper of VTS 2015 and the Best Innovative Practices presentation will be invited to resubmit to the IEEE Design & Test of Computers where they will undergo a regular, but expedited, review process.
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered in conjunction with VTS 2016. Tutorial proposals should be submitted according to TTEP 2016 submission guidelines, which will be posted on http://computer.org/tab/tttc/teg/ttep
All submissions are to be made electronically through the VTS website.
The deadline for all submissions is October 16th, 2015. Detailed instructions for submissions will be found at the symposium website http://www.tttc-vts.org.
Authors will be notified of the disposition of their papers by December 20th, 2015.
A submission will be considered as evidence that, upon acceptance, the author(s) will submit a final camera-ready version of the paper for inclusion in the proceedings, and will present the paper at the symposium. A full registration of at least one author is required for publication. In the case of innovative practices and special sessions, the organizers commit to submitting a session title, abstract and list of participants for inclusion in the symposium proceedings.
For general information:
University of Texas at Dallas
For submission-related information:
University of Grenoble-Alpes/TIMA
Innovative Practices Track:
New Initiatives Chair:
Electronic Media Chair:
Corporate Support Chair:
For more information, visit us on the web at: http://tttc-vts.org
The 34th IEEE VLSI TEST SYMPOSIUM is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
TTTC 1ST VICE CHAIR
ITC GENERAL CHAIR
TEST WEEK COORDINATOR
TUTORIALS AND EDUCATION
MIDDLE EAST & AFRICA
PRESIDENT OF BOARD
SENIOR PAST CHAIR
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
ASIA & PACIFIC
INDUSTRY ADVISORY BOARD