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Bob Madge Innovation Award
CALL FOR NOMINATIONS
The Bob Madge Innovation Award will recognize “Innovation that Matters” in the area of Semiconductor Design, Test and Data Analysis. Nominations are invited from all active researchers, academicians and industry personnel for this award instituted in the respectful and loving memory of our colleague, Bob Madge (1963-2014).
The nominations must be for research work concluded or with significant results published in the past 5 years. This annual award will include an honorarium, memento and will be presented at the International Test Conference (www.itctestweek.org). The selection committee is a diverse team representing a cross section of renowned industry and university researchers.
For detailed information about the submission process, requirements, the selection process and any other questions regarding the award program, please contact Phil Nigh (email@example.com) or Rao Desineni (firstname.lastname@example.org).
Thank you very much for your nominations. We look forward to celebrating your Innovation at the International Test Conference in October 2015.
Please see below for key dates.
Bob Madge loved to fly. Aviation coalesced his gifts as a pilot and engineer, and he excelled as both. He worked as he lived -- letting his ideas fly.
IEEE Computer Society- Test Technology Technical Council
TTTC 1ST VICE CHAIR
ITC GENERAL CHAIR
TEST WEEK COORDINATOR
TUTORIALS AND EDUCATION
MIDDLE EAST & AFRICA
PRESIDENT OF BOARD
SENIOR PAST CHAIR
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
ASIA & PACIFIC
INDUSTRY ADVISORY BOARD