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TTTC's Electronic Broadcasting Service
8th IEEE International Workshop on Silicon Debug and Diagnosis
Immediately following the 2012 International Test Conference
CALL FOR PAPERS
Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work is however very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market. New and efficient solutions for debug and diagnosis have a much needed and highly visible impact on productivity.
SDD 2012 will be held in Anaheim, California, USA. It is the eighth of a series of highly successful technical workshops that consider issues related to debug & diagnosis of semiconductor circuits and systems - from prototype bring-up to volume production.
The topics of interest include, but are not limited to, the following:
The workshop objective is to facilitate an interactive information exchange. Extended abstracts and papers may be short. Proposals that describe open issues, industry/technology needs or opinions are valuable to the program. The SDD 2012 workshop does not have a formal proceedings, however an informal digest of papers will be distributed to the workshop participants. Furthermore, the authors of the best contributions to the SDD 2012 workshop will be invited by the program and general chair to submit an extended version of their work to a special section on Silicon Debug and Diagnosis to be published by IEEE Design & Test of Computers in Summer 2013.
Length Guideline: ranging from one page extended abstract to 8 pages.
Proposals for discussion panels, new topics and other special sessions are also invited. Much of the success of the event has been a result of crafting sessions based on participant interest. Please submit a 1 page abstract or discuss the issue with Program or Special Sessions Chairs.
Submission deadline: September 7, 2012
For more information, visit us on the web at: http://sdd.tttc-events.org
The 8th IEEE International Workshop on Silicon Debug and Diagnosis(SDD 2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC