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European Test Symposium
CALL FOR PAPERS
The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing.
In 2011 ETS will take place in Trondheim, Norway and is being organized by the Norwegian University of Science and Technology (NTNU) and sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society. Norway is known for its white summer nights; during the week of ETS'11 the sun will rise in Trondheim well before 4am and set close to 11pm.
You are invited to participate and submit your contributions to ETS’11. The areas of interest include
|ETS’11 seeks original, unpublished contributions of the following types:
Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS’11 web page.
The ETS’11 organizing committee also encourages the organization of fringe meetings and workshops. Details can be found on the ETS`11 web page.
ETS’11 will produce Formal Proceedings of selected papers and an Informal Digest of Papers. The best contributions will be selected for submission to regular issues of the “Journal of Electronic Testing: Theory and Applications” (JETTA), published by Springer. A Best Paper Award of ETS’11 will be presented at ETS’12.
Submission deadline: December 6, 2010
Einar J. Aas – General Chair
Erik Larsson – Program Chair
General Chair/ Vice Chair
Industrial Relations Chair/Vice-Chair
Embedded Tutorial Chair
Einar J. Aas, NO - Chair
For more information, visit us on the web at: http://www.ieee-ets.org
The European Test Symposium (ETS 2011 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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