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IEEE VLSI TEST SYMPOSIUM (VTS 2009)
Advance Registration Deadline Extended to April 24th!
CALL FOR PARTICIPATION
The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world's leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2009 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Panels, New Topic Sessions, Full-day Tutorials, co-located Workshops, and the Innovative Practices Track.
Keynote: John Kibarian, CEO and President of PDF
Invited Keynote: Bozena Kaminska, Canadian Research Chair, Simon Fraser Univ., Canada
TECHNICAL PAPER SESSIONS will present the latest research results in test, including:
INNOVATIVE PRACTICES (IP) TRACK highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them.
SPECIAL SESSIONS will include:
FULL-DAY TUTORIALS and WORKSHOPS complement the core technical program of VTS.
TEST TECHNOLOGY EDUCATIONAL PROGRAM (TTEP) TUTORIALS
The social program at VTS provides an opportunity for informal technical discussions among participants. This year, the social program will feature a visit to a local winery (transportation provided) and a banquet sunset dinner on the beach. Santa Cruz, California provides a very attractive backdrop for all VTS 2009 activities. We are sure that you will find VTS 2009 enlightening, thought-provoking, rewarding, and enjoyable!
Submission Related Information
Innovative Practices Track
For more information, visit us on the web at: http://www.tttc-vts.org
The 27th IEEE VLSI TEST SYMPOSIUM (VTS 2009) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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