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The Ninth IEEE Workshop on RTL and High Level Testing
(To be held in conjunction with ATS'08)
CALL FOR PARTICIPATION
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing. Areas of interest include:
Advance registration deadline: October 24, 2008
This year we set up the theme of "Power/Thermal-Aware Testing", which we believe needs to be discussed not only at gate level but also from high level in this workshop. The following keynote speech, invited talk, and panel discussion on this theme will be scheduled in the afternoon of the first day, November 27.
Keynote Speech: "Power-Aware System-on-Chip Testing" by Erik Larsson, Linkopings University, Sweden
Invited Talk: " Power: The New Dimension of Test" by Patrick Girard, LIRMM, France
Panel: "Roads to Power-Safe LSI Testing"
Twenty three papers in the WRTLT'08 scope will be presented in regular sessions. The advance program will be available by the end of September on our web-site.
Local Arrangement Chair
Audio Visual Chair
Takashi Aikyo, Japan
Chair: Xiaowei Li, China
For more information, visit us on the web at: http://www.event URL.com
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT08) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), and the Technical Group on Dependable Computing, IEICE .
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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