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IEEE International Workshop on Silicon Debug and Diagnosis (SDD08)
Held in Conjunction with IEEE VLSI Test Symposium 2008 (VTS 2008)
CALL FOR PAPERS
Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work can however become very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market, the traditional focus on only pass/fail testing and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity.
SDD08 will be held in San Diego, California, USA. It is the fifth in a series of highly successful technical workshops. Its mission and objective is to consider all issues related to debug and diagnosis of systems and circuits – from prototype bring-up to volume production.
The topics of interest include, but are not limited to, the following:
The workshop objective is to facilitate a valuable interactive information exchange. Contributions ranging from extended abstracts to full papers are acceptable for submission. Contributions that provide more detail have a higher chance of being accepted. Proposals that describe open issues, industry/technology needs or opinions are also welcome.
For general information contact:
For submission & program information contact:
For more information, visit us on the web at: http://www.sdd-online.org
The 5th IEEE International Workshop on Silicon Debug and Diagnosis (SDD07) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
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