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Asian Test Symposium (ATS'08)
CALL FOR PAPERS
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. The official language of the symposium is English.
Topics of interest include, but are not limited to:
REGULAR SESSION : The ATS'08 Program Committee invites original, unpublished paper submissions for ATS'08. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author.
An abstract of 50 words or less and 5-10 keywords are also required. All submissions are to be made electronically through the ATS'08 website. Detailed instructions for submissions are to be found at the ATS'08 website. Electronic submissions in PDF files are strongly recommended.
The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript (six pages for regular session) in time for inclusion in the proceedings and will present the paper at the Symposium.
SESSION : This session will address a wide range of practical problems in LSI test,
board and system test, diagnosis, failure analysis, design verification, and so on. A one-page
abstract is required for submission. Each submission should also include the complete address
and designate a contact person and a presenter. Abstract submissions should be emailed to
Local Arrangement Chair
Local Arrangement Vice-Chair
Audio Visual Chair
North American Liaison
Program Committee Members:
For general information:
For regular session information:
For industry session information:
For more information, visit us on the web at: http://ats08.info.hiroshima-cu.ac.jp
The Seventeenth Asian Test Symposium (ATS'08) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), the IEICE Information and Systems Society Technical Committee on DC, and the IEICE Kyushu Institute of Technology (approval pending) .
IEEE Computer Society- Test Technology Technical Council
TTTC 2ND VICE CHAIR
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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