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IOST3 - 2007: IEEE INTERNATIONAL WORKSHOP on OPEN SOURCE TEST TECHNOLOGY TOOLS
May 9-10, 2007
Berkeley, California
Held in conjunction with IEEE VLSI Test Symposium (VTS-07)

http://IOST3.org/

 
ONLINE REGISTRATION IS NOW AVAILABLE AT: https://www.cemamerica.com/vts2007/
Advance Registration Rates End April 23, 2007
CALL FOR PARTICIPATION

The IOST3 workshop supports a community of practice focused on open source and open interface tools for test, quality assurance, and reliability estimation of electronic devices, assemblies, and systems.

This year's Workshop will focus on data management – test vector standards, datalogs, validation and analytical tools, and particularly on the aggregation and correlation of data from disparate sources that effective collaboration can provide. Design data for IC's, subassemblies, and systems, failure and repair reports, and production equipment histories all play a role in identifying root causes and improving reliability. The warp and woof of collaboration and competition create the fabric of civilization's progress, and the Open Source milieu has been found to provide a dramatic new means to facilitate that progress. IOST3 is exploring that milieu for the benefit of semiconductor and system test in a worldwide community.

IOST3 Preliminary Schedule
Claremont Resort and Spa, Berkeley CA

Wednesday, May 9, 2007

4:00 pm

Welcome
Burnell West, IOST3 General Chair

4:15 pm

Program Introduction
Scott Davidson, Sun Microsystems, Program Chair

4:30 pm
Keynote Address
Paul Muray, Sun Microsystems
5:15 pm Open Discussion
6:15 pm WINE & CHEESE RECEPTION

Thursday, May 10, 2007

7:30 am REGISTRATION & CONTINENTAL BREAKFAST
8:00 am
Session 2: Open Source Information for ICs
8:00 am

Device, Subassembly, and System Data Structures for Test and Reliability
B. West

8:30 am

Comparative Mixed-signal Test Method and Toolset
A. Mellik, J. Raik - Tallinn University of Technology

9:00 am

Globally Optimized Robust Systems Research:Open Source Tools and Techniques
S. Mitra - Stanford Univ.

9:30 am

An Extensible Evolutionary-based General-purpose Optimizer
E. Sanchez, M. Schillaci, G. Squillero - Politecnico di Torino

10:00 am BREAK
10:30 am
Session 3: Open Source Standards
10:30 am

STIL Progress and Common STIL Tools
T. Taylor

11:00 am

IEEE 1500 Compliant Self-Test Design Library
D. Appello - STM; P. Bernardi, M. Grosso, W. Sanchez, M. Sonza Reorda, J Lagos-Benites - Politecnico di Torino

2:00 pm

Standardizing Fail datalog format for Volume Diagnostics
Ajay Khoche - Verigy

12:00 noon LUNCH
3:00 pm
Session 4: Managing Data for Quality
1:30 pm

Shared Analysis of system level data speeds diagnosis of ASIC NTFs
M. Kamm - Cisco

2:00 pm

Guitar: A Visualization Tool for Returns and Other Information
S. Davidson, A. Hale - Sun Microsystems

2:30 pm

Test Technology Collaboration Consortium
B. Price - NXP Semiconductors

3:00 pm BREAK
3:30 pm

Wrap-up Discussion

For more information, visit us on the web at: http://iost3.org/

The IOST3 2007: IEEE International Workshop on Open Source Test Technology Tools is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TTTC 2ND VICE CHAIR
Joan FIGUERAS
Universitat Politècnica de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG

Lucent Technologies
- USA
Tel. +1-732-949-5539
E-mail chenhuan@lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Jill E. SIBERT
Raspberry Comm.
- USA
Tel. +1-484-894-1111
E-mail jill_sibert@raspberrycom.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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