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ITC Special Section in
Getting More out of Test
SPECIAL CALL FOR PAPERS
IEEE Design and Test of Computers is looking for new manuscripts for the special ITC section in the September-October 2006 issue. The theme of the issue, and of the 2006 International Test Conference, is Getting More out of Test.
Submissions must be new material. We are not looking reprint previously published ITC papers, however submissions containing significantly new work based on previously published papers will be accepted.
Manuscripts must not exceed 5,000 words (with each average-size figure counting as 150 words toward this limit), including a maximum of 12 references, as well as tables, figures with captions, and biographies. This amounts to about 4,200 words of text and five figures. Authors should also include a cover page with author contact information (name, postal address, phone, fax, and e-mail address), a 150-word abstract, and four or five index terms.
Manuscripts to be considered should be submitted through Manuscript Central (directions at http://www.computer.org/dt/author.htm) with a copy in PDF sent to the guest editor. The due date for manuscripts is May 5, 2006. Author notifications will be sent June 2, and the revised version of an accepted paper is due no later than June 30. There is a limited amount of space in this issue, however accepted manuscripts for which there is no space will be published in a later issue.
Paper topics include but are not limited to:
IEEE Computer Society– Test Technology Technical Council
IEEE DESIGN & TEST EIC
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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