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IEEE North Atlantic Test Workshop (NATW 2006)
CALL FOR PAPERS
The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient testing methodologies and designs. The 15th workshop will feature "Testing in the high frequency world". The major topics include, but are not limited to, the following:
The Program Committee invites authors to submit original, unpublished paper and panel proposals. Submissions may be in terms of extended summaries or full papers.
Best Student Presentation Award
To encourage student participation in the research community, we will have sessions dedicated to student presentations and present a Best Student Presentation Award. We feel that it is important to integrate students into the research community early in their careers so that they can experience the excitement of direct interaction with their peers.
For general information, contact:
Submit paper proposals to:
For more information, visit us on the web at: http://www.ee.duke.edu/NATW/
15th IEEE North Atlantic Test Workshop (NATW 2006) is sponsored, in part,
by the Institute of Electrical and Electronics Engineers (IEEE) VT Section
and the IEEE Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council
IEEE DESIGN & TEST EIC
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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