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24th IEEE VLSI TEST SYMPOSIUM (VTS
CALL FOR PAPERS
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification/validation of microelectronic circuits and systems. Major topics include, but are not limited to:
The VTS Program Committee invites original, unpublished paper submissions for VTS 2006. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.
Proposals for the
Innovative Practices track, and Special
Sessions, are also invited. The innovative practices track
highlight cutting-edge challenges faced by test practitioners, and
innovative solutions employed to address them. Special sessions can
include panels, embedded tutorials, or hot topic presentations.
practices track and special session proposals should include a title,
and contact information of the session organizer(s), a 150-to-200 word
abstract, and a list of prospective participants.
All submissions are to be made electronically through the VTS website. The deadline for all submissions is 7th October 2005. Detailed instructions for submissions are to be found at the conference website http://www.tttc-vts.org. Authors will be notified of the disposition of their papers by 6th January 2006. A submission will be considered as evidence that, upon acceptance, the author(s) will present the paper at the symposium, and will submit a final camera-ready version of the paper for inclusion in the proceedings by a date that will be specified later. In the case of innovative practice and special sessions, the organizers commit to submit a session title, abstract, and list of participants for inclusion in the symposium proceedings and program by a date that will be specified later. VTS 2006 will present a Best Paper Award, a Best Panel Award, and a Best IP Track Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges.
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during VTS 2006. Tutorial proposals should be submitted according to TTEP 2006 submission deadlines: (http://computer.org/tab/tttc/teg/ttep).
For more information on the VTS 2006 Test Event, visit the VTS website at http://www.tttc-vts.org or contact:
For general information:
For submission related information:
Innovative Practices Track
For more information, visit us on the web at: http://www.tttc-vts.org
The 24th IEEE VLSI TEST SYMPOSIUM (VTS 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council
SENIOR PAST CHAIR
IEEE DESIGN & TEST
ASIA & SOUTH PACIFIC
INDUSTRY ADVISORY BOARD
TTTC 1ST VICE CHAIR
ITC GENERAL CHAIR
TEST WEEK COORDINATOR
TUTORIALS AND EDUCATION
MIDDLE EAST & AFRICA
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