- 6th IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST’15 ) – CALL FOR PARTICIPATION 2
- 37th IEEE VLSI Test Symposium 2019 – CALL FOR PARTICIPATION 2
- IEEE Transactions on Emerging Topics in Computing Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems 2
- [VTS’20] 38th IEEE VLSI Test Symposium 2020 – Call for papers
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 – CALL FOR PARTICIPATION 2
- [DATE 2019] Design Automation and Test in Europe – Call for tutorial participation
- [DATE 2019] Design Automation and Test in Europe – Call for tutorial participation 2
- IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis 2015 (DATA’15 ) – CALL FOR PARTICIPATION
- [VTS’19] 37th IEEE VLSI Test Symposium 2019 – CALL FOR PARTICIPATION 2
- 24th IEEE European Test Symposium 2019 – CALL FOR PARTICIPATION
- 4th International Verification and Security Workshop (IVSW) 2019 – Call for Participation 2
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 – DEADLINE EXTENSION 2
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 – DEADLINE EXTENSION
- [ETS 2020] 25th IEEE European Test Symposium – Call for Papers 2
- [ETS’19] IEEE 24th European Test Symposium 2019 – Ph.D. Forum – Deadline approaching
- 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) – Call for Participation 2
- [ETS 2020] 25th IEEE European Test Symposium – Call for Papers
- [DATE 2019] Design Automation and Test in Europe – Call for participation 2
- [ETS 2020] 25th IEEE European Test Symposium – Call for Contributions
- [VTS’19] 37th IEEE VLSI Test Symposium 2019 – CALL FOR PARTICIPATION 5
- IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis 2015 (DATA’15 ) – DEADLINE EXTENSION
- [VTS’20] 38th IEEE VLSI Test Symposium 2020 – Call for papers 2
- [VTS’19] 37th IEEE VLSI Test Symposium 2019 – CALL FOR PARTICIPATION 3
- The 15th IEEE Workshop on Silicon Errors in Logic System Effects – Call for papers
- 25th IEEE International Symposium on On-Line Testing and Robust System Design – Deadline Extension 2
- [ETS’19] IEEE 24th European Test Symposium 2019 – TTTC E. J. McCluskey Best Doctoral Thesis Award
- [VTS’20] 38th IEEE VLSI Test Symposium 2020 – DEADLINE EXTENDED 2
- BELAS – Call for papers Call for participation
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- IEEE Transactions on Emerging Topics in Computing Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems
- 4th International Verification and Security Workshop (IVSW) 2019 – Call for Participation
- 24th IEEE European Test Symposium 2019 – CALL FOR PARTICIPATION 2
- [TESTA’19] 4th International Test Standards Application Workshop – Call for Contributions 2
- [ETS 2020] 25th IEEE European Test Symposium – extended deadline 2
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- [DATE 2019] Design Automation and Test in Europe – Call for participation
- [VTS’19] 37th IEEE VLSI Test Symposium 2019 – TTTC E. J. McCluskey Best Doctoral Thesis Award
- TSS@ETS 2016 Call for Participation
- 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 – CALL FOR PAPERS 2
- IEEE VLSI Test Symposium 2016 (VTS’16 ) – CALL FOR PARTICIPATION
- [ETS 2020] 25th IEEE European Test Symposium – extended deadline
- 1st IEEE Federative Event on Design for Robustness (FEDfRo) – Call for participation
- IEEE Technical Meeting on Reliable, Safe, Secure, and Time-Deterministic Intelligent Systems and 1st IEEE Computer Society Global Chapter Summit
- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test – CALL FOR SUBMISSIONS
- 6th IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST’15 ) – CALL FOR PARTICIPATION
- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test – CALL FOR SUBMISSIONS 3
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 – CALL FOR PARTICIPATION
- [ETS’19] IEEE 24th European Test Symposium 2019 – Ph.D. Forum – Call for participation
- IEEE TETC Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems 2
- TTTC Elections for 2020-2021
- The 15th IEEE Workshop on Silicon Errors in Logic System Effects – Call for papers 2
- IEEE Technical Meeting on Reliable, Safe, Secure, and Time-Deterministic Intelligent Systems and 1st IEEE Computer Society Global Chapter Summit 2
- 37th IEEE International Conference on Computer Design – Call for papers 2
- [ETS’19] IEEE 24th European Test Symposium 2019 – Ph.D. Forum – Deadline approaching 2
- IEEE TETC Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems
- 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) – Call for Participation
- 25th IEEE International Symposium on On-Line Testing and Robust System Design – Call for papers 2
- [VTS’19] 37th IEEE VLSI Test Symposium 2019 – CALL FOR PARTICIPATION
- 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 – CALL FOR PAPERS
- 37th IEEE VLSI Test Symposium 2019 – CALL FOR PARTICIPATION
- [ETS 2020] 25th IEEE European Test Symposium – Call for Contributions 2
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- 25th IEEE International Symposium on On-Line Testing and Robust System Design – Call for papers
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- [ETS’19] IEEE 24th European Test Symposium 2019 – TTTC E. J. McCluskey Best Doctoral Thesis Award 2
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- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test – CALL FOR SUBMISSIONS 2
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