- 6th IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST'15 ) - CALL FOR PARTICIPATION 2
- 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION 2
- IEEE Transactions on Emerging Topics in Computing Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems 2
- [VTS'20] 38th IEEE VLSI Test Symposium 2020 - Call for papers
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 - CALL FOR PARTICIPATION 2
- [DATE 2019] Design Automation and Test in Europe - Call for tutorial participation
- [DATE 2019] Design Automation and Test in Europe - Call for tutorial participation 2
- IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis 2015 (DATA'15 ) - CALL FOR PARTICIPATION
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION 2
- 24th IEEE European Test Symposium 2019 - CALL FOR PARTICIPATION
- 4th International Verification and Security Workshop (IVSW) 2019 - Call for Participation 2
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 - DEADLINE EXTENSION 2
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 - DEADLINE EXTENSION
- [ETS 2020] 25th IEEE European Test Symposium - Call for Papers 2
- [ETS'19] IEEE 24th European Test Symposium 2019 - Ph.D. Forum - Deadline approaching
- 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) - Call for Participation 2
- [ETS 2020] 25th IEEE European Test Symposium - Call for Papers
- [DATE 2019] Design Automation and Test in Europe - Call for participation 2
- [ETS 2020] 25th IEEE European Test Symposium - Call for Contributions
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION 5
- IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis 2015 (DATA'15 ) - DEADLINE EXTENSION
- [VTS'20] 38th IEEE VLSI Test Symposium 2020 - Call for papers 2
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION 3
- The 15th IEEE Workshop on Silicon Errors in Logic System Effects - Call for papers
- 25th IEEE International Symposium on On-Line Testing and Robust System Design - Deadline Extension 2
- [ETS'19] IEEE 24th European Test Symposium 2019 - TTTC E. J. McCluskey Best Doctoral Thesis Award
- [VTS'20] 38th IEEE VLSI Test Symposium 2020 - DEADLINE EXTENDED 2
- BELAS - Call for papers Call for participation
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION 4
- IEEE Transactions on Emerging Topics in Computing Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems
- 4th International Verification and Security Workshop (IVSW) 2019 - Call for Participation
- 24th IEEE European Test Symposium 2019 - CALL FOR PARTICIPATION 2
- [TESTA'19] 4th International Test Standards Application Workshop - Call for Contributions 2
- [ETS 2020] 25th IEEE European Test Symposium - extended deadline 2
- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test - CALL FOR SUBMISSIONS 4
- [DATE 2019] Design Automation and Test in Europe - Call for participation
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - TTTC E. J. McCluskey Best Doctoral Thesis Award
- TSS@ETS 2016 Call for Participation
- 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 - CALL FOR PAPERS 2
- IEEE VLSI Test Symposium 2016 (VTS'16 ) - CALL FOR PARTICIPATION
- [ETS 2020] 25th IEEE European Test Symposium - extended deadline
- 1st IEEE Federative Event on Design for Robustness (FEDfRo) - Call for participation
- IEEE Technical Meeting on Reliable, Safe, Secure, and Time-Deterministic Intelligent Systems and 1st IEEE Computer Society Global Chapter Summit
- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test - CALL FOR SUBMISSIONS
- 6th IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST'15 ) - CALL FOR PARTICIPATION
- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test - CALL FOR SUBMISSIONS 3
- 22nd International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 - CALL FOR PARTICIPATION
- [ETS'19] IEEE 24th European Test Symposium 2019 - Ph.D. Forum - Call for participation
- IEEE TETC Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems 2
- TTTC Elections for 2020-2021
- The 15th IEEE Workshop on Silicon Errors in Logic System Effects - Call for papers 2
- IEEE Technical Meeting on Reliable, Safe, Secure, and Time-Deterministic Intelligent Systems and 1st IEEE Computer Society Global Chapter Summit 2
- 37th IEEE International Conference on Computer Design - Call for papers 2
- [ETS'19] IEEE 24th European Test Symposium 2019 - Ph.D. Forum - Deadline approaching 2
- IEEE TETC Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems
- 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) - Call for Participation
- 25th IEEE International Symposium on On-Line Testing and Robust System Design - Call for papers 2
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION
- 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuit and Systems DDECS19 - CALL FOR PAPERS
- 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION
- [ETS 2020] 25th IEEE European Test Symposium - Call for Contributions 2
- TTTC Elections for 2020-2021 2
- 25th IEEE International Symposium on On-Line Testing and Robust System Design - Call for papers
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - CALL FOR PARTICIPATION 6
- [ETS'19] IEEE 24th European Test Symposium 2019 - TTTC E. J. McCluskey Best Doctoral Thesis Award 2
- 12th IEEE Workshop on Silicon Errors in Logic System Effects (SELSE'16) - CALL FOR PARTICIPATION
- [TESTA'19] 4th International Test Standards Application Workshop - Call for Contributions
- [ETS'19] IEEE 24th European Test Symposium 2019 - Ph.D. Forum - Call for participation 2
- 37th IEEE International Conference on Computer Design - Call for papers
- [VTS'20] 38th IEEE VLSI Test Symposium 2020 - DEADLINE EXTENDED
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Call for participation
- [VTS'19] 37th IEEE VLSI Test Symposium 2019 - TTTC E. J. McCluskey Best Doctoral Thesis Award 2
- [ART 2019] Fourth IEEE International Workshop on Automotive Reliability & Test - CALL FOR SUBMISSIONS 2
- 25th IEEE International Symposium on On-Line Testing and Robust System Design - Deadline Extension
