- [ETS 2019] 24th IEEE European Test Symposium - Deadline extension 2
- [LATS19] 20th IEEE Latin-American Test Symposium - Call for papers
- [DFT2018 CfP - Deadline Extension] IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- [ETS 2019] 24th IEEE European Test Symposium - Call for papers 2
- 25th IEEE International Symposium on On-Line Testing and Robust System Design - Call for papers 2
- [TTEP 2019] TEST TECHNOLOGY EDUCATIONAL PROGRAM 2019 - First Call for Tutorial Proposals (DATE, LATS, VTS)
- [ETS 2019] 24th IEEE European Test Symposium - Deadline extension 3
- 3rd International Verification and Security Workshop 2018 - Call for papers
- The 27th IEEE Asian Test Symposium - Call for papers 2
- 3rd International Verification and Security Workshop 2018 - Deadline extension
- 20th IEEE Latin-American Test Symposium - Call for papers
- [ETS 2019] 24th IEEE European Test Symposium - Deadline extension
- [ETS 2019] 24th IEEE European Test Symposium - Call for papers
- [ETS 2019] 24th IEEE European Test Symposium - Deadline extension 4
- The 15th IEEE Workshop on Silicon Errors in Logic System Effects - Call for papers 2
- 24th IEEE International Symposium on On-Line Testing and Robust System Design - Extended deadline
- 20th IEEE Latin-American Test Symposium - Call for papers 2
- [DDECS19] 22nd IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Call for papers
- 36th IEEE VLSI Test Symposium - PhD Forum abd TTTC’s E. J. McCluskey Best Doctoral Thesis 2018 Award Contest
- The 27th IEEE Asian Test Symposium - Call for papers
- [ART 2018] Third IEEE International Workshop on Automotive Reliability & Test - CALL FOR SUBMISSIONS - EXTENDED DEADLINE
- [LASCAS 2019] call for papers
- XXXIII Conference on Design of Circuits and Integrated Systems (DCIS) - Call for papers
- IEEE TTEP tutorials at VTS 2018 - Call for participation
- 25th IEEE International Symposium on On-Line Testing and Robust System Design - Call for papers
- [ART 2018] Third IEEE International Workshop on Automotive Reliability & Test - CALL FOR SUBMISSIONS
- The 15th IEEE Workshop on Silicon Errors in Logic System Effects - Call for papers
- 3rd International Verification and Security Workshop (IVSW) 2018 - CfP (extended deadline)
- [DFT2018 CfP] IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
