- [DFT2017 CfP] IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- IEEE TTEP tutorials at VTS 2017 – Call for participation
- IMSTW joins IOLTS at FEDfRo!
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems – Call for participation
- IEEE International Verification and Security Workshop (IVSW 2017) – Call for papers
- [EWDTS17 CfP] IEEE 15th IEEE East-West Design & Test Symposium
- 36th IEEE VLSI Test Symposium – Call for papers
- 22nd IEEE European Test Symposium (ETS 2017) – Call for participation
- 28th International Symposium onPower and Timing Modeling, Optimization and Simulation (PATMOS) 2018 – Call for papers
- 36th IEEE VLSI Test Symposium – DEADLINE EXTENSION
- IEEE VLSI Test Symposium 2017 (VTS’17 ) – TTTC E. J. McCluskey Best Doctoral Thesis Award
- 36th IEEE VLSI Test Symposium – DEADLINE EXTENSION 2
- 36th IEEE VLSI Test Symposium – Call for papers 2
- IEEE TTEP tutorials at ITC’17 – Call for participation
- 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) – Call for participation
- The 26th IEEE Asian Test Symposium – Call for participation
- 22nd International Mixed-Signal Testing Workshop – Call for Papers
- 24th IEEE International Symposium on On-Line Testing and Robust System Design – Call for papers
- IEEE International High-Level Design Validation and Test Workshop 2017 – Call fro Work in Progress Papers
- IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis 2017 – Call for papers
- IEEE International Test Conference 2017 – Call for papers
- The 26th IEEE Asian Test Symposium (ATS 2017) – Call for participation
- IEEE TETC – Special Issue on Reliability-aware Design and Analysis Methods for Digital Systems (Deadline extension)
- The 26th IEEE Asian Test Symposium (ATS17) – Deadline extension
- The 14th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE 2018) – Call for papers
- The 26th IEEE Asian Test Symposium (ATS17) – Call for papers
- AQTR 2018 – IEEE International Conference on Automation, Quality and Testing, Robotics – Call for papers
- 24th IEEE International Symposium on On-Line Testing and Robust System Design – CFP and Special Issue on IEEE TDMR
- 35th IEEE VLSI TEST SYMPOSIUM – Call For Participation
- 23rd IEEE European Test Symposium 2018 – Call for papers
- 12th IEEE International Design & Test Symposium – Call for papers
- IEEE International Workshop on Automotive Reliability & Test 2017 – Call for papers
- 18th IEEE Workshop on RTL and High Level Testing (WRTLT 2017) – Call for papers
- 19th IEEE Latin American Test Symposium (LATS) – Call for Papers
- [DFT2017 CfP – Deadline Extension] IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- 23rd IEEE International Symposium on On-Line Testing and Robust System Design – Call for papers
- Call for Papers 22nd International Mixed-Signal Testing Workshop