2010 Finals held at International Test Conference (ITC) in Austin, TX, USA
1st place: Stephan Eggersgluess, University of Bremen (Advisor: Prof. Rolf Drechsler)
Title: Robust Algorithms for High Quality Test Pattern Generation using Boolean Satisfiability
2nd place: Hsiu-Ming (Sherman) Chang, University of California, Santa Barbara, USA (Advisor: Prof. Tim Cheng)
Title: Low-Cost Quality Assurance Techniques for High-Performance Mixed-Signal/RF Circuits and Systems
3rd place: Alex Roschildt Pinto, Universidade Federal de Santa Catarina, Brazil (Advisor: Prof. Carlos Montez)
Title: Autonomic Methods for Enhancing Communication Quality of Service in Dense Wireless Sensor Networks with Real Time Requirements
VTS’10 semi-finals winners:
1st place: Hsiu-Ming (Sherman) Chang, UCSB
Title: Low-Cost Quality Assurance Techniques for High-Performance Mixed-Signal/RF Circuits and Systems
2nd place: Ho Fai Ko, McMaster University
Title: New Algorithms and Architectures for Post-Silicon Validation
3rd place: Alodeep Sanyal, U. Mass Amherst
Title: On Detection, Analysis, and Characterization of Transient and Parametric Failures in Nano-scale CMOS VLSI
LATW’10 semi-finals winners:
1st place: Alex Roschildt Pinto, Universidade Federal de Santa Catarina, Brazil
Title: Autonomic Methods for Enhancing Communication Quality of Service in Dense Wireless Sensor Networks with Real Time Requirements
2nd place: Daniel Camara, Universidade Federal de Minas Gerais, Brazil
Title: Formal Verification of Communication Protocols for Wireless Networks
3rd place: Tiago Balen, Universidade Federal do Rio Grande do Sul, Brazil
Title: Radiation Effects on Programmable Analog Devices and Mitigation Techniques
ETS’10 semi-finals winners:
1st place: Stephan Eggersgluess, University of Bremen
Title: Robust Algorithms for High Quality Test Pattern Generation using Boolean Satisfiability
2nd place: Syed Saqib Khursheed, University of Southampton
Title: Test and Diagnosis of Resistive Bridges in Multi-Vdd Design
3rd place: Abdul-Wahid Hakmi, University of Stuttgart
Title: Efficient Programmable Deterministic Self-Test