Scope

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TTTC’s interests encompass a wide variety of technologies, since each area in electronic test depends on its own specialized instrumentation and techniques.

A number of technologies are usually needed to test a single product thereby increasing the challenge. TTTC’s current scope includes, but is not limited to:

  • Testing of analog, digital, memory, FPGA, SiP, and RF Semiconductor circuits
  • Testing of embedded cores, integrated circuits, MCMs, boards and systems
  • Testability methods: built-in self-test, scan, and test synthesis
  • Verification and Validation
  • Embedded Test, ATE, Test resource partitioning
  • Yield Optimization, defect/fault tolerance and embedded repair methodologies
  • Infrastructure IP
  • On-line, IDDQ, thermal testing
  • Transient faults, soft errors, robustness, field reliability
  • Debug and Diagnosis

scope