Facebook
Twitter
Mail

Register to
TTTC newsletter

Membership
People
Activities
Meetings
Standards
Worldwide
Awards
EBS
- 2021
- 2020
- 2019
- 2018
- 2017
- 2016
- 2015
- 2014
- 2013
- 2012
- 2011
- 2010
- 2009
- 2008
- 2007
- 2006
- 2005

DfM&Y 2006

October 16, 2014

DfM&Y: Int’l Workshop on Design for Manufacturability & Yield

From October 26, 2006 to October 27, 2006
Where: Santa Clara, CA, USA

Previous: LATS 2016

Next: BAST 2007

Membership
People
Activities
Meetings
Standards
Worldwide
Awards
EBS
- 2021
- 2020
- 2019
- 2018
- 2017
- 2016
- 2015
- 2014
- 2013
- 2012
- 2011
- 2010
- 2009
- 2008
- 2007
- 2006
- 2005

The Test Technology Technical Community (TTTC) shall consist of all aspects of test as they pertain to test implementation, test design, manufacturing test and standardization in semiconductor, software, magnetic and optical devices and systems. Specific technical areas of interest include test of analog, digital and memory semiconductor integrated circuits, automatic test program generation, testability methods, built-in-test structures, automatic test equipment, board and system test procedures, hardware test algorithm development, synthesis algorithm development for hardware test and design integration, software test methods, magnetic storage system test, test of optical devices and systems, manufacturing test at all fabrication levels and field service testing. TTTC provides educational programs which include conferences, symposia, workshops and tutorials. TTTC maintains information and communication amongst the membership to include publications and newsletters.

© 2022 Ona, Made by DeoThemes

Privacy Policy
Terms & Conditions