Category: Standards
The Test Technology Technical Community supports the development and maintenance of several IEEE standards.
The following is an overview of Test Technology standards:
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Test Access Port and Boundary-ScanChristopher J. CLARK, Cclark@intellitech.com
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Mixed Signal Test BusBambang SUPARJO, bambang_suparjo@mentor.com
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Boundary Scan Testing of Advanced Digital NetworksBill EKLOW, beklow@cisco.com
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Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary Scan ArchitectureRobert OSHANA, robert.oshana@freescale.com
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Standard Tester Interface Language (STIL)Gregory MASTON, gmaston@synopsys.com
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Extensions to STIL for Semiconductor Design EnvironmentTony TAYLOR, t.taylor@ieee.org
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Extensions to STIL for DC Level SpecificationGregg WILDER, gwilder@ti.com
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Extensions to STIL for Tester Target SpecificationTony TAYLOR, t.taylor@ieee.org
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Extensions to STIL for Test Flow SpecificationDoug SPRAGUE, dsprauge@us.ibm.comJim O’REILLY, jim_oreilly@ieee.org
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Standard for Describing On-Chip Scan CompressionBruce CORY, bcory@nvidia.com