The Test Technology Technical Community supports the development and maintenance of several IEEE standards.

The following is an overview of Test Technology standards:

IEEE 1149.1

Test Access Port and Boundary-ScanChristopher J. CLARK,

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IEEE 1149.4

Mixed Signal Test BusBambang SUPARJO,

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IEEE 1149.6

Boundary Scan Testing of Advanced Digital NetworksBill EKLOW,

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IEEE P1149.7

Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary Scan ArchitectureRobert OSHANA,

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IEEE 1450-1999

Standard Tester Interface Language (STIL)Gregory MASTON,

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IEEE 1450.1

Extensions to STIL for Semiconductor Design EnvironmentTony TAYLOR,

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IEEE 1450.2-2002

Extensions to STIL for DC Level SpecificationGregg WILDER,

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IEEE P1450.3

Extensions to STIL for Tester Target SpecificationTony TAYLOR,

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IEEE P1450.4

Extensions to STIL for Test Flow SpecificationDoug SPRAGUE, O’REILLY,

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IEEE P1450.6-1

Standard for Describing On-Chip Scan CompressionBruce CORY,

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